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  • Self-testing chips take a load off ATE
    with density. This trend has forced an emphasis on design-for-test (DFT) techniques that both find ways of compressing test requirements and help minimize the need to regularly boost ATE test-pattern memory. In this simple example of a functional test, a low signal on the scan enable input lets
  • Assembly Technology Expo 2006 hosts creator of Dilbert
    , to assembly and test. A sampling of exhibitors in the EAP includes 3M Electronics, Markets Materials Div., Aqueous Technologies, Assembleon, Asymtek, Explore a fully functional, doublesided surface-mount-technology manufacturing line, and take home the end product as a souvenir of the show

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