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  • Laser Welding Carbon Nanocomposites
    in the initial experimentation to quantify weld strength. The experimentation included a complete analysis of the transmission characteristics of the base polymer at 810 nm and 1,064 nm wavelengths, an optical microscope view of the weld cross-section, and transmission welding experimentation
  • Microstructural Analysis of Optical Materials (.pdf)
    ) in the scanning electron microscope (SEM).
  • MICRO: Prod Tech News
    for both imaging and repair. Patented environmental SEM technology enables E-beam repair and high-resolution E-beam imaging. The system also features an optical microscope for mask navigation and global alignment. The Cal=Trak SL-500 primary standard gas-flow calibrator is a fast, mercury-free
  • MICRO: Defect Analysis and Metrology - Ge (Feb 2000)
    than the maximum AFM scan size required to find ~0.1- um defects easily. This limitation makes AFM-only defect review difficult and time-consuming. To surmount this limitation, an integrated defect review tool combining a dark-field (DF) optical microscope with an automated TappingMode AFM has been
  • Three-dimensional, single-molecule fluorescence imaging beyond the diffraction limit by using a double-helix point spread function
    We demonstrate single-molecule fluorescence imaging beyond the optical diffraction limit in 3 dimensions with a wide-field microscope that exhibits a double-helix point spread function (DH-PSF).
  • Medical Device Link .
    is acquired becomes the principal factor limiting throughput of slide-digitizing and HTS systems. An optical technology that increases the depth of field of microscope imaging systems also increases the speed and efficiency of automated slide-screening and discovery applications. This technology, called
  • Fast Focus
    A special feedback technique lets inspection systems ID problems in circuitry far more quickly than with bruteforce methods. The autofocus head visible here typically sits between the microscope and the optical system for inspecting flat-panel circuits. The autofocus function lets the system image
  • Imaging of Guided and Scattered Light From Silicon Photonic Integrated Circuits
    "In order to characterize compact planar optical devices it is necessary to couple light from off-chip sources and laboratory based measurement equipment using standard optical fibre technology. Given the small waveguide cross-sectional area it is often difficult to align both input and output

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