Products & Services

See also: Categories | Featured Products | Technical Articles | More Information

Conduct Research Top

  • Theory and Use of Curved Surface Correction (CSC) Software in Olympus NDT EPOCH Series Flaw Detectors
    Contemporary digital ultrasonic flaw detectors calculate commonly used parameters for reflector position in angle beam testing, typically including sound path length, flaw depth, surface distance, and beam leg. These calculations are based on a measured pulse transit time, calibrated material sound
  • MICRO: Defect/Yield Analysis and Metrology - Collins (June 2000)
    layer in transparent multilayer film stacks on product wafers. However, there was no comparable metrology system for the analysis of opaque multilayer metal (MLM) film stacks (as depicted in Figure 1) until 1997, when Rudolph Technologies (Flanders, NJ) introduced picosecond ultrasonic laser sonar
  • Ultrasound scans IN THIN AIR
    Better transducers and inexpensive, high-accuracy gantries expand the scope of noncontact ultrasound imaging. The marriage of Airtech 4000 ultrasonic imagers and Techno-Isel gantries lets users generate ultrasound-image scans without having the probe touch the sample. The gantry accurately moves

More Information Top

Lock Indicates content that may require registration and/or purchase. Powered by IHS Goldfire