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  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    software with IA-64 patents NEW YORK -- A flurry of more than 20 new patents suggests Intel Corp. is expanding its time-tested legal strategy to prevent cloning of its new, flagship IA-64 architecture. ADE claims KLA-Tencor violating wafer inspection patent WESTWOOD, Mass. -- ADE Corp. here has
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    : Micron cell innovation changes DRAM economics National's Q2 sales jumps 11%, sees 0-3% growth in Q3 The price plunge peters out Xilinx co-founder, executive Bernie Vonderschmitt dies ICOS acquires Siemens' wafer inspection business Intel mulling chip plant
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    and South Korea this week, following moves initiated last year in U.S. courts and with the U.S. International Trade Commission. France's i2S rolls out module for wafer inspection
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    , the worldwide chip-equipment industry posted a book-to-bill ratio of 0.82 in April, up from 0.71 in March, according to VLSI Research Inc. Applied to roll 'bright field' inspection tool, says report Applied Materials Inc. is expected to introduce "a bright field wafer inspection tool. " The Week
  • An Innovative Cabling Concept Improves Reliability for Multi-Axis Stage Systems
    up to 4 separate cables (with diameters of 8 to 14 mm). And up to 27 electrical wires must be connected. Wafer inspection systems in the semiconductor industry typically consist of a stack of XYZ linear stages plus a theta rotary unit. So there can easily be perhaps 16 connectors at the final
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    drives MicroSensors receives patent for silicon micromachined gyro sensor France's Soitec, Gemplus target SOI wafers for smart-card ICs Veeco adds thin-film inspection, ion-beam deposition through two mergers PMC-Sierra's networking-chip strategy lifts earnings Patton leaves Schlumberger
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    Heard on the Beat (June 22) Heard on the Beat (June 22) Commentary & analysis of week's chip news UMC says fab closure report is 'speculation' United Microelectronics Corp is keeping quiet about rumors that it will temporarily shut down one of its 8-inch wafer fabrication facilities due to low
  • AN3018: Known Good Die Delivery Specification
    This application note describes M/A-COM's standard Known Good Die (KGD) delivery practices for use in high volume commercial applications. All KGD are electrically tested, visually inspected, and delivered in wafer form. Consult the factory if your application requires special test, inspection
  • EETimes.com | Electronics Industry News for EEs & Engineering Managers
    SEMI names president of China office The Semiconductor Equipment and Materials International (SEMI) trade group announced the promotion of Yee-Ming Ting to the position of president of its new China office. Nano-Or rolls out tabletop unit for 3D inspection Nano-Or Technologies Ltd. here introduced

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