Semiconductor Metrology Instruments Suppliers in Tokyo, Japan

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
See suppliers in Japan
Find Semiconductor Metrology Instruments by country
 
Zygo Corporation
Address: Shiba NBF Tower 3F 1-1-30 Shibadaimon Minato-ku, Tokyo, 105-0012 Japan
Business Type: Manufacturer, Service
Description: Zygo is a global leader in the design and manufacture of advanced optical metrology systems and ultra-precise optical components and assemblies. Our mission is to enable customer success by delivering innovative precision optical and metrology solutions. Our Metrology... (more)

Products

View Catalog