Ion Milling Systems Suppliers in New York

Ion milling systems use an ion beam to thin samples for transmission electron microscopy. Focused ion beam (FIB) systems use a narrow high current beam to mill specific regions or a low current beams to image samples (FIM). (more)
Carl Zeiss MicroImaging, Inc.
Address: One Zeiss Dr., Thornwood, NY 10594 United States
Business Type: Manufacturer