Rigaku's Primini Biofuel is suitable for phosphorus analysis in biodiesel for EN14214 and ASTM D6751. It is optimized for sub-ppm detection limits of P, S and Cl and features easy operation without chemical treatment of the samples. Easy sample preparation and operation reduces the need for a highly skilled operator. A helium atmosphere is maintained in the spectroscopic chamber and sealing film separates the sample chamber from the spectroscopic chamber, protecting the X-ray tube and the spectrometer in the event of a spilled oil sample.

Phosphorus in biodiesel, which comes from lipids in the fuel, is harmful to diesel engines, so control of phosphorus content is crucial. Sulfur content in the raw material is very low, which means that the content of sulfur in biodiesel is also very low. However, since the sulfur contents in regular gasoline is regulated for environmental reasons, the content of sulfur in biodiesel oil is regulated as well.

Rigaku NEX CG delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — with minimal standards.

Unlike conventional EDXRF analyzers, the NEX CG was engineered with a unique close-coupled Cartesian Geometry (CG) optical kernel that dramatically increases signal-to-noise. By using secondary target excitation, instead of convention direct excitation, sensitivity is further improved. The resulting dramatic reduction in background noise, and simultaneous increase in element peaks, result in a spectrometer capable of routine trace element analysis even in difficult sample types.

NEX CG is powered by a new qualitative and quantitative analytical software, RPF-SQX, that features Rigaku Profile Fitting (RPF) technology. The software allows semi-quantitative analysis of almost all sample types without standards — and rigorous quantitative analysis with standards.

As the world's only high-power benchtop sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer for elemental analysis of fluorine (F) through uranium (U) of almost any material, the Rigaku Supermini uniquely delivers low cost-of-ownership (COA) with high resolution and lower limits-of-detection (LLD).

Not only is the Rigaku Supermini an affordable choice for your XRF elemental analysis needs, the running costs are also low. P10 gas for the flow proportional detector is the only consumable. Supermini does not require a source of cooling water, plumbing, or an external chiller, thereby decreasing system maintenance and lowering the overall lifetime cost of ownership of the system and yearly budgets for consumables and maintenance.

Analyzing complex matrix materials with a wide range of light and heavy elements, from trace to high concentration levels, is the instrument's core competency. Rigaku Supermini delivers high sensitivity for light elements with superior spectral resolution for resolving line overlaps in a complex matrices without the need for deconvolution. Analyzing low concentration levels of light elements (F, Na, Mg, Ca, Si, Al, and P) is easy.

Supermini is the only high powered (200 W) X-ray tube benchtop WDXRF system, providing excellent excitation resulting in lower detection limits and shorter measurement times. A unique and proprietary optical system is also employed to enhance sensitivity beyond the gains of the tube power.

Rigaku's WaferX 300 represents the culmination of 25 years of experience in the X-ray fluorescence analysis of thin films on silicon wafers. Specifically developed as an in-process metrology tool, the system incorporates "bridge tool" technology — servicing 6", 8", as well as the latest 12" wafers.

The WaferX 300 is ideal for measuring BPSG, PSG and metal films. In addition, thin film BPSG, multilayered circuit film, WSix, electrode films, ferrodielectric thin films, FRAM, next generation DRAM, and SiOF are standard applications for this tool.

Highly accurate analyses for the ultralight elements such as B and P in BPSG film has been improved significantly by employing a 4kW high power X-ray tube with a super thin window beryllium window.

The instrument employs a wafer height adjustment mechanism to compensate for differences in wafer thickness and a diffraction beam removal mechanism to eliminate diffraction interference for the transition metals. Integrated FOUP(SMIF) is available, supporting the C-to-C standard. Various user cassettes can also be loaded. FOUP(SMIF) through-the-wall option is available.

As a premium low cost benchtop Energy Dispersive X-ray Fluorescence (EDXRF) spectrometer, the Rigaku NEX QC delivers wide elemental coverage with an easy-to-learn software interface in a robust package designed for industrial at-line quality control elemental analysis applications.

Specifically designed for routine quality control applications, the new Rigaku NEX QC features an intuitive "icon-driven" touch screen interface for easy operation and a built-in printer for convenience.

The shuttered 50kV X-ray tube and Peltier cooled semiconductor detector deliver exceptional short-term repeatability and long-term reproducibility with excellent element peak resolution. This high voltage capability (50 kV), along with multiple automated X-ray tube filters, provides a wide range of applications versatility and low limits-of-detection (LOD).

Options include fundamental parameters, automatic sample changer, sample spinner and helium purge for enhanced light element sensitivity.

The WDA-3650 X-ray fluorescence spectrometer for thin film evaluation continues Rigaku's 30-year history of XRF wafer analyzers that has mirrored the history of thin film device development. This latest XRF metrology tool contributes significantly to the process control of metal film thickness, film composition, and element concentration with new functions and a low-COO design.

A versatile and reliable tool for 200 mm and smaller wafers, the WDA-3650 incorporates our trademark X-Y-θ sample stage system for superior results on difficult measurements, such as ferrodielectric films. Multiple channels enable simultaneous measurement of multiple elements of interest for high throughput. The high energy resolution of this wavelength-dispersive XRF system, compared to energy-dispersive XRF systems, is especially useful to minimize peak overlap when element peaks are closely spaced.

For boron applications, the available AD-Boron channel provides 5-times greater sensitivity than previous models. The AutoCal function and built-in internal wafer stocker, previously only available on 300mm tools, enable fully-automated daily tool qualification and intensity calibration.

The WDA-3650 is extremely compact with the basic unit requiring less than 1 m² of valuable cleanroom space, and there is no need for side maintenance service access. Power consumption has been reduced more than 20% compared to the previous model.

Winner of the 2007 R&D 100 award, a mark of excellence known to industry, government, and academia as proof that the winner is one of the most innovative products of the year, the Rigaku NANOHUNTER benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to offer comprehensive trace element and materials characterization analysis capabilities to a broader range of research disciplines, and in more diverse analytical settings, than was possible with previous technology. Whether for geologists, chemists, biochemists, biologists, materials scientists and engineers, non-destructive trace element analysis is attainable, with minimal to no sample preparation, for applications that span from metallo-protein research to environmental assessment and semiconductor wafer metrology.

Providing both trace-level elemental analysis and evaluation of the physical nature of the sample, NANOHUNTER uses a patented switchable wavelength and automated variable X-ray incidence angle excitation design. The instrument can analyze the full range of elements, from aluminum (Al) to uranium (U), in solids, liquids, and powders. It also provides chemical information as a function of analysis depth for profiling surface characteristics of materials. As an example, for researchers involved in nano-technology, this ability allows surface layers to be characterized as particles on a substrate, a homogenous thin film, or as something in between.

With sensitivity on par with inductively coupled plasma optical emission spectroscopy (ICP-OES), NANOHUNTER provides part-per-billion (PPB) level detection limits in a fully automated tool. Direct measurement of solids and powders provides freedom from complex sample digestion or preparation and makes this spectrometer suitable for replacing or supplementing traditional atomic spectroscopy methods. Compared to other trace level atomic spectroscopy techniques, the revolutionary aspect of NANOHUNTER is in the minimal level of sample preparation required. It liberates the operator from ancillary equipment – like fume hoods and microwave digesters – associated with trace element analysis in a wet laboratory environment.

Rigaku ZSX Primus II delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

ZSX Primus II features an innovative optics-above configuration. Never again worry about a contaminated beam path or down time due to sample chamber maintenance. The optics-above geometry eliminates cleaning worries and increases up time.

Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus II features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus II allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

The newest version of our popular multi-channel simultaneous wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system is the Simultix 14. Based on over 30 years of accumulated experience, the Simultix 14 stands out as the most advanced, fully automated system available — designed to meet today's analytical needs for utmost sensitivity, throughput, and versatility.

Capable of analyzing elements from beryllium through uranium, the spectrometer was designed to have the smallest possible footprint—making it the definitive choice where space is at a premium. With its sophisticated hardware and multi-tasking software, the Simultix 14 offers the most effective elemental analysis tool to satisfy the needs of all fields of industrial applications.

Simultix 14 provides simultaneous analysis of elements from beryllium (Be) through uranium (U). Equipped with a 3 kW (or optional 4 kW) 60 kV end-window X-ray tube, for analysis of up to 40 elements, the instrument is equipped for background corrections of all fixed channels and additionally features log curved crystals and optimized optical paths.

Rigaku's unique ZSX 400 sequential wavelength dispersive X-ray fluorescence (WDXRF) spectrometer was specifically designed to handle very large and/or heavy samples. Accepting samples up to 400 mm diameter, 50 mm thick and 30 kg weight, this system is ideal for analyzing sputtering targets, magnetic disks, or for multilayer film metrology or elemental analysis of large samples.

Having the versatility to adapt to your specific sample types and analysis needs, the ZSX 400 is adaptable to various sample sizes and shapes using optional (made to order) adapter inserts. With a variable measurement spot (30 mm to 0.5 mm diameter with 5-step automatic selection) and mapping capability with multi-point measurements to check for sample uniformity, this uniquely flexible instrument can dramatically streamline your quality control processes.

Optional real-time camera allows the analysis point to be viewed on screen. The operator has complete certainty as to what is being measured.

All analytical capabilities of a traditional instrument are retained in this "large sample" variant. Analyze beryllium (Be) through uranium (U) with high-resolution, high-precision WDXRF spectroscopy, from solids to liquids and powders to thin films. Analyze wide composition ranges (ppm to tens of percent) and thicknesses (sub Å to mm). Optionally available is diffraction peak interference rejection, for optimal results for single-crystal substrates. The Rigaku ZSX 400 complies with industry standards SEMI and CE.

Rigaku ZSX Primus delivers rapid quantitative determination of major and minor atomic elements, from beryllium (Be) through uranium (U), in a wide variety of sample types — with minimal standards.

The latest instrument in Rigaku's ZSX series, the ZSX Primus continues the tradition of delivering accurate results in a timely and seamless manner, with unsurpassed reliability, flexibility, and ease of use to meet any challenges in today's laboratory.

Providing superior performance with the flexibility for analyzing the most complex samples, the ZSX Primus features a 30 micron tube, the thinnest end-window tube available in the industry, for exceptional light element (low-Z) detection limits. Combined with the most advanced mapping package to detect homogeneity and inclusions, the ZSX Primus allows easy detailed investigation of samples that provide analytical insights not easily obtained by other analytical methodologies. Available multi-spot analysis also helps to eliminate sampling errors in inhomogeneous materials.

EZ-scan allows users to analyze unknown samples without any prior setup. This time saving feature requires only a few clicks of the mouse and a sample name to be entered. Combined with SQX fundamental parameters software, it provides the most accurate and rapid XRF results possible. SQX is capable of automatically correcting for all matrix effects, including line overlaps. SQX can also correct for secondary excitation effect by photoelectrons (light and ultra-light elements), varying atmospheres, impurities and different sample sizes. Increased accuracy is achieved using matching library and perfect scan analysis programs.

Specifically designed for rapid batch testing of low and ultra-low sulfur diesel (ULSD) and gasoline fuel samples, the compact benchtop Mini-Z Sulfur analyzer is designed for easy use by non-technical personnel. Whether at petroleum pipeline terminals, refineries, or testing laboratories, the robust design is hardened for industrial use with minimal maintenance.

With many advantages over competing products and technologies, the Mini-Z Sulfur analyzer delivers an unmatched lower limit-of detection, a wide analysis range, and the best repeatability in the industry. It does not require combustible gases and runs on standard 110 VAC (USA) wall power (other voltages and frequencies are supported too).

The Mini-Z Sulfur analyzer, with a range of 0.26 ppm up to 4 wt%, complies with the most popular international standards for low sulfur measurements, including ASTM D-2622, ISO 20884 and JIS K 2541-7.

The R-XAS X-ray absorption spectrometer is a versatile in-house instrument capable of performing XAS, XANES, and EXAFS measurements. This laboratory system enables these measurements to be made in-house without the need to travel to a synchrotron site. The system uses a specially developed 3.0 kW X-ray generator with easily replaceable filaments and target materials to optimize X-ray flux for a wide range of elements. A range of incident crystal types allows tuning of the incident X-ray beam energy such that elements form Ca to U can be measured. Both transmission and fluorescence measurements are possible. A complete data analysis package allowing background subtractions, least squares fitting of the data, Fourier transform analysis and Fourier filtering for single shell refinements, is included with the system.

X-ray Absorption Spectroscopy (XAS) includes both Extended X-Ray Absorption Fine Structure (EXAFS) and X-ray Absorption Near Edge Structure (XANES). XAS is the measurement of the x-ray absorption coefficient of a material as a function of energy. XAS is an interdisciplinary technique and its unique properties, as compared to x-ray diffraction, have been exploited for understanding the details of local structure in: glass, amorphous and liquid systems, solid solutions, doping and ionic implantation materials for electronics, local distortions of crystal lattices, organometallic compounds, metalloproteins, metal clusters, vibrational dynamics, ions in solutions and the speciation of elements.