The LIV100 is a powerful pulsed current test system for use in the lab as well as for OEM applications, ideal for

• Diode characterization at the chip or bar level
• Quality control of incoming goods
• OEM

We offer this instrument with a variety of end stages covering current ranges from 1A up to 400A. A complete parameter set for a given measurement protocoll may be uploaded to the LIV100. The LIV100 then takes over the measurement procedure beginning with a test of proper laser contact. Once this preliminary test is passed, the unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 1s for 200 current steps 1 including the data transfer to the host computer.

Specifications

• Current: from 1A up to 400A
• Rise time: <50ns 2
• Throughput: <1s per diode 1
• USB-controlled via command list
• Up to 6 channels of synchronized data acquisition
• Optical spectrum: resolution~0.1nm

The LIV120 is a powerful but low cost CW / QCW test sy stem for use in the lab as well as for OEM applications, ideal for

• Burn-in Test Equipment
• Diode characterization
• Quality control of incoming goods
• OEM

We offer this instrument with a variety of end stages covering current ranges up to 2A in a compact enclosure and up to 120A using an external current driver end stage. The low power versions use our OPM150 laser power detector heads with all of the comfor t of intelligent head technology for cost- efficient swapping of detector heads. This feature is very useful when testing a wide range of wavelengths or when testing free beam and fibre coupled lasers. A complete parameter set for a given measurement protocoll may be uploaded to the LIV120. The LIV120 then takes over the measurement procedure. The unit drives the laser with the given prescription and performs the data acquisition and storage. Many laser diodes of the same type may now be tested in this manner with very high throughput. The measurement cycle takes less than 1s including the data tranfer to the host computer 1 .

Features

• Spectrum (optional)
• Pass / fail reporting
• Stop sweep on optical threshold
• Measures optical power, monitor diode current, laser voltage and laser current

Highlights:

• High throughput
• CW and QCW
• LIV and Burn-In