FT230 | Automated XRF for rapid coatings analysis

Simply Smarter

The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up’ itself, making it possible to analyze many more parts within a single shift.

Automation and innovative software are what makes the FT230 analyzer. Smart Recognition modules such as Find My Part™ mean that all the operator needs to do is load the sample, confirm the part and the FT230 takes care of the rest. It will find the right measurement locations on your part – even on large substrates – select the correct analysis program and send the results to your quality system. Time and human error are reduced, and you get more analysis done in less time, making 100% inspection much more realistic in a busy production environment.

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