Product Announcements: Electron Microscopes

Phenom-World is focused on giving you the opportunity to process ever-smaller samples and increase your productivity, while bringing down the costs of analysis. The Phenom G2 pro desktop scanning electron microscope (SEM) is the most effective, versatile and fastest desktop SEM available. Its unique design makes it suitable for use in a large variety of applications and markets. (read more)

The Phenom Pro Suite is developed to enable Phenom users to extract maximum information from images made with the Phenom desktop scanning electron microscope (SEM). Itextends the capabilities of the Phenom, a high-resolution imaging tool, providing solutions to specific application needs. (read more)

The Phenom proX desktop scanning electron microscope is the ultimate all-in-one imaging and X-ray analysis system.
All Phenom-World products are intuitive to use, fast to create results and built to high quality standards. (read more)

The new Phenom Programming Interface (PPI) is a must-have for any customer that wants to integrate their Phenom desktop SEM into a production process or for creating a customized solution. (read more)

With the Phenom desktop scanning electron microscope (SEM) and the Fibermetric System, we offer solutions based on world renown electron optics. (read more)

The Phenom G2 pure desktop (tabletop) scanning electron microscope (SEM) is the ideal tool for making the transition from working with a light microscope to operating an electron microscope. The Phenom G2 pure is equipped with the basic fundamentals for meeting imaging needs.

The Phenom G2 pure provides high-quality images while using basic features, and offers the market's fastes... (read more)

Now, direct observation and measurement of micro and nano fibers is faster, better and easier than ever before, with the improved Fibermetric application. (read more)

Phenom-World has developed, together with its preferred development partner Deben, a Temperature Controlled Sample Holder to study vacuum-sensitive and vulnerable samples. The Temperature Controlled Sample Holder is able to control the temperature by cooling or heating the sample and therefore influence the humidity around it. (read more)

The properties of many engineering materials are mostly governed by a combination of metal composition

and the morphology and distribution of key microstructural features. These features can be observed with

conventional optical microscopy. However, when higher magnification and 3D detail is required, a scanning

electron microscope (SEM) is best suited. (read more)