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Solid-state or semiconductor X-ray diffraction detectors collect diffracted intensity from one angle at a time and are scanned through the angular range of interest. These detectors provide the energy resolution of a diffracted-beam monochromator without the associated intensity loss and offer a three- to fourfold speed advantage over a scintillation detector and monochromator. Various types of solid state detectors exist such as Germanium, Si(Li) (lithium drifted silicon), CCD (charge coupled device), PDA (photo diode array), PIPS (passivated implanted planar silicon) and SSB (silicon surface barrier). The semiconductor detectors typically require cryogenic cooling to improve the signal to noise ratio. Products & Services
X-ray diffraction instruments are used to measure crystal structure, grain size, texture and/or residual stress of materials and compounds through interaction of the X-ray beam with a sample.
Scintillation detectors and luminescence counters are used to detect gamma, x-ray and neutron radiation. They consist of a detector for sensing incident radiation and a photomultiplier for producing countable pulses.
Optical crystals are transparent in different spectral regions, depending upon the crystal material.
Monochromators are optical subassemblies used to isolate narrow portions of a light spectrum. They accept polychromatic input from a lamp or laser, and outputs monochromatic light.
Radiation detectors are used for medical diagnoses, radioactive dating measurements, and measurements of background radiation, activity levels and radiation doses.
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Position sensitive detectors (PSD) are proportional counters that use gas ionization and a localized electron-avalance process to amplify the signal from a detected X-ray. Both linear (1-D) and area...
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Monochromators are spectrometer optical systems capable of measuring a single wavelength, which can be scanned through a wide wavelength range. A common form of monochromator is the Czerny-Turner...
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Absorption: The portion of optical attenuation in an optical fiber resulting from the conversion of optical power to heat; caused by impurities such as hydroxyl ions in the fiber.
A/B Switch: A...
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X-ray inspection imaging sources such as X-ray computed tomography and digital radiography (CT & DR) are important methods of non-destructively testing, characterizing and accurately defining internal...
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A breadboard setup constructed at MOXTEK, Inc., is capable of capturing both x-ray diffraction (XRD) and x-ray fluorescence (XRF) information simultaneously using a charge-coupled device (CCD) as the...
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Optics & Lenses - Industry Glossary
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