Phase Imaging: Beyond Topography (AN11)

Phase Imaging is a powerful extension of TappingMode™ Atomic Force Microscopy (AFM) that provides nanometer-scale information about surface structure and properties often not revealed by other SPM techniques. By mapping the phase of the cantilever oscillation during the TappingMode scan, phase imaging goes beyond simple topographical mapping to detect variations in composition, adhesion, friction, viscoelasticity, and numerous other properties. Applications include identification of contaminants, mapping of different components in composite materials, and differentiating regions of high and low surface adhesion or hardness. Applications also include mapping of electrical and magnetic properties with wide-ranging implications in data storage and semiconductor industries. In many cases, phase imaging complements lateral force microscopy (LFM), and force modulation techniques, often providing additional information more rapidly and with higher resolution. Phase imaging is as fast and easy to use as TappingMode AFM -with all its benefits for imaging soft, adhesive, easily damaged or loosely bound samples.