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• 3D Atomic Force Microscopy as an Alternative to X-SEM and TEM for Advanced Process Metrology (Machine Vision Equipment)
  From this Article:

  As increasing demand for smaller device feature data drives wafer development costs up, process developers seek new metrology solutions to better address today's stringent process requirements.... (View Full Article)
• 3D MEMS Metrology with Optical Profilers (Calibration and Testing Services)
  From this Article:

  Faster product development and reduced time-to-market have made optical surface profilers essential tools for three-dimensional metrology of MEMS. The Veeco Instruments Wyko® NT Series Optical... (View Full Article)
• 3D MEMS Metrology with Stylus Profilers (AN60) (Lab and Test Equipment)
  From this Article:

  Three dimensional measurement capability is increasingly a key requirement for manufacturing commercially viable MEMS. Stylus profiling and the Atomic Force Profiler (AFPTM) solve certain metrology... (View Full Article)
• 3D MEMS Metrology with the Atomic Force Microscope (AN55) (Product and Material Testing)
  From this Article:

  Veeco Metrology Group, through its Digital Instruments and TM Microscopes divisions, offers several lines of scanning probe microscopes (SPM) capable of atomic force microscopy (AFM). Large sample... (View Full Article)
• Absolute Flatness Testing Using a Laser Interferomter (Calibration and Testing Services)
  From this Article:

  Absolute flatness testing is an interferometric method for obtaining the surface shape of flats, independent of the shape of the reference flat used in the test. In this method, a user measures three... (View Full Article)
• Accurate Thick Film Measurement with Optical Profiling (Calibration and Testing Services)
  From this Article:

  Thick films (~3µm and larger) are used widely in the design and manufacture of MEMS devices, semiconductors and hybrid circuits. Accurate control over film thickness and uniformity is essential for... (View Full Article)
• Advanced Sensor Fabrication Using Integrated Ion Beam Etch and Ion Beam Deposition Processes (Vacuum Equipment)
  From this Article:

  Digital data storage and memory (MRAM) devices based on Giant Magneto-Resistant (GMR) effect elements are pushing the envelope of fabrication techniques used in their manufacture. Fabrication of these... (View Full Article)
• Advantages of Using Dektak Surface Profilers with Vision 3d Analysis Software (Industrial and Engineering Software)
  From this Article:

  Stylus-based surface profi ling is a standard technique for accurate, repeatable surface shape, topography and step height measurement in applications ranging from semiconductor R&D to solar cell QC.... (View Full Article)
• AFM Imaging and Force Spectroscopy of Individual Bacterial Adhesions (AN92) (Lab and Test Equipment)
  From this Article:

  Because microbial surfaces are in direct contact with the external environment, they are vital to organisms. Microbial surfaces play key roles in determining cellular shape and growth, enabling... (View Full Article)
• Ancient Gold Coins (AN524) (Lab and Test Equipment)
  From this Article:

  A series of French gold coins minted in 1786 bore Louis XVI's effigy with a notorious additional feature-each seems to include one, sometimes two, "horns" upon the king's forehead. (Figure 1). A... (View Full Article)
• Application AFM in Cosmetics Hair (AN88) (Lab and Test Equipment)
  From this Article:

  Trace Laser beam to Detector Cantilever (Twist) Fast direction Retrace of raster-scan AFM Cantilever tip twist = Higher friction areas Figure 2. An electron micrograph of AFM cantilever and tip. In... (View Full Article)
• Applications of Atomic Force Microscopy for Contact Lens Manufacturing (AN22) (Lab and Test Equipment)
  From this Article:

  Atomic Force Microscopy (AFM) has advanced biomaterials R&D by offering the unique ability to analyze surface properties non-destructively with nanometer-level resolution in ambient air or liquids.... (View Full Article)
• Applications of Force Volume Imaging with the Atomic Force Microscope (AN20) (Lab and Test Equipment)
  From this Article:

  Any small particle that approaches a surface experiences a number of forces before and after contact with the surface. Using an atomic force microscope (AFM) tip, or a small particle attached to an... (View Full Article)
• Applications of Reactive Ion Beam Etching to Thin Film Magnetic Head Track-Width Trimming (Desktop Personal Computers)
  From this Article:

  The write element of a computer hard-drive head, at the most basic level, is a magnet with two poles. The structure, width, and spacing of these poles determine the performance of the recording head,... (View Full Article)
• Atomic Force Microscope Study of Dental Enamel Structure and Synthesis (AN86) (Lab and Test Equipment)
  From this Article:

  Atomic Force Microscope Study of Dental Enamel Structure and Synthesis Dr. Stefan Habelitz Human tooth enamel takes up to 4 Natural Dental Enamel F. Michael Serry years to form and mature. The growth... (View Full Article)
• Atomic Force Microscopy in the Investigation of Gene Delivery Vehicles (AN67) (Lab and Test Equipment)
  From this Article:

  By maintaining a constant deflection during scanning, a constant vertical force is maintained between the tip and sample. Although contact mode has proven useful for a wide range of applications, it... (View Full Article)
• Atomic Force Microscopy in the Pharmaceutical Sciences: Drug Interactions and Disease Mechanisms (AN56) (Lab and Test Equipment)
  From this Article:

  Since atomic force microscopy (AFM) provides the ability to investigate surface structure at nanometerto-subangstrom resolution in ambient and liquid environments, it has been used routinely over the... (View Full Article)
• Atomic Force Microscopy of Microbial Cells (AN50) (Lab and Test Equipment)
  From this Article:

  Microbial cells (bacteria, yeasts and fungal spores) are surrounded by fairly rigid cell walls which play several vital functions: protecting the cytoplasm from the outer environment, providing the... (View Full Article)
• Automatic Step Detection Feature for Dektak Surface Profilers (Calibration and Testing Services)
  From this Article:

  Dektak® stylus profilers provide accurate step height measurements from several nanometers through hundreds of microns, with repeatability down to 7.5 Angstroms1. A unique Step Detection feature... (View Full Article)
• Automotive Component Manufacturing (Calibration and Testing Services)
  From this Article:

  White light interferometry (optical profiling) is a well- established technique for non-contact, 3D surface roughness and topography measurements. The method's unique combination of resolution, speed... (View Full Article)
• Blades and Sharps Measurements (Calibration and Testing Services)
  From this Article:

  Precision blades and cutting instruments are responsible for everything from a clean shave to a successful medical procedure. Careful quality control over surface finish and cutting angles is critical... (View Full Article)
• Calibration Techniques and Tips for Dektak Stylus Profilers Ensuring Long-Term Accuracy and Repeatability (Calibration and Testing Services)
  From this Article:

  Dektak® stylus profilers measure steps and roughness with exceptional repeatability and accuracy. Because of their excellent performance, researchers and quality professionals rely upon Dektak... (View Full Article)
• Cantilever spring constant calibration using laser Doppler vibrometry (Lab and Test Equipment)
  From this Article:

  Uncertainty in cantilever spring constants is a critical issue in atomic force microscopy (AFM) force measurements. Though numerous methods exist for calibrating cantilever spring constants, the... (View Full Article)
• Characterizing AFM Cantilevers with Dynamic MEMS (AN536) (Lab and Test Equipment)
  From this Article:

  Micro-machined, cantilever beams are the backbones of atomic force microscopy (AFM) measurement probes. The beams are designed to resonate at particular frequencies; understanding how the tips perform... (View Full Article)
• Characterizing CMP Pad Conditioner (AN540) (Industrial Cleaning and Surface Preparation)
  From this Article:

  Faster computer processors require smaller features for integrated circuits (IC), which in turn require smoother substrate surfaces. Chemical mechanical polishing (CMP) has become one of the most... (View Full Article)
• Characterizing MEMS Devices Through Transparent Media (Calibration and Testing Services)
  From this Article:

  Optical profiling (white light interferometry) has long served as a standard technique for measuring surface topography of MEMS and optical MEMS devices. To date, most measurements have been made... (View Full Article)
• Characterizing Surface Quality: Why Average Roughness is Not Enough (Surface Coating and Protection)
  From this Article:

  Three dimensional surface measurement techniques and parameters are well understood and widely adopted for characterizing surface finish and performance. Nevertheless, in many applications 2D... (View Full Article)
• Characterizing Wear with 3D Optical Profiling (Calibration and Testing Services)
  From this Article:

  Understanding wear and its underlying causes is critical to the manufacture and maintenance of structures, seals, drive trains, medical devices, etc. Yet wear is extremely difficult to quantify-no... (View Full Article)
• Choosing AFM Probes for Biological Applications (AN44) (Lab and Test Equipment)
  From this Article:

  AFM has proven to be a powerful tool for biological studies. Applications include imaging molecules, cells, tissues, biomaterials, and measuring forces. Relative to such techniques as electron... (View Full Article)
• Combined Fluorescence and Atomic Force Microscopy for Cytoskeleton Morphology (AN98) (Lab and Test Equipment)
  From this Article:

  Fluorescence microscopy has become an indispensable tool in cell biology because it allows specific proteins to be visualized. Atomic force microscopy (AFM) is also becoming extensively used in the... (View Full Article)
• Control Sidewall Spacer Geometry with Next-Generation In-Line 3D-AFM (Machine Vision Equipment)
  From this Article:

  Gate spacer engineering has become one of the primary concerns in dimension metrology. This application note discusses recent advances in 3D atomic force microscopy (3D-AFM) that solve the specialized... (View Full Article)
• Controlling Metrology Bias: Using a CD AFM to Calibrate Other Metrology Systems (AN74) (Lab and Test Equipment)
  From this Article:

  "CD measurements must account for side wall shape. Process control such as (stepper) focus, exposure and etch bias will require greater precision and 3D capability." A restatement of this ITRS 2001... (View Full Article)
• Corrosion Studies with AFM, Part I (AN87) (Lab and Test Equipment)
  From this Article:

  Atomic Force Microscopy (AFM) offers 3 primary modes for imaging: Contact mode, TappingMode, and Torsion Resonance Mode (TRmode). Each primary mode enables numerous other modes, which we collectively... (View Full Article)
• Cost-Effective Thin-Film Bulk Acoustic Resonator (FBAR) Production (Vacuum Equipment)
  From this Article:

  Next-generation wireless communication devices depend on cost-effective, high-frequency components for 2.5G and 3G services. Device manufacturers need bandpass filters that are smaller, consume less... (View Full Article)
• Custom Analyses with MATLAB (Industrial and Engineering Software)
  From this Article:

  Veeco's Vision® software leads the industry for 3D data analysis, with over 200 analysis tools including 2D and 3D plots, histograms, and many application-specific tools and parameters. Even with... (View Full Article)
• Customizing Stage Files for Advanced Automated Measurements (Calibration and Testing Services)
  From this Article:

  The X/Y and X/Y Grid features in Wyko® Vision® software are extremely versatile and serve most applications well, allowing user-customizable measurement patterns. However, there are times... (View Full Article)
• Dektak Stylus Capabilities: How to Chose the Correct Stylus for Any Appliction (Calibration and Testing Services)
  From this Article:

  Dektak® stylus profilers provide accurate, high resolution measurement of surface shape and texture. The heart of a Dektak system is its measurement stylus, which runs over the surface as the... (View Full Article)
• Direct Measurement of Single Immunocomplex Formation by Atomic Force Microscopy (AN14) (Lab and Test Equipment)
  From this Article:

  In order to understand the functioning of biological systems, knowledge about the character of specific biomolecular interactions is crucial. This application note will demonstrate the use of atomic... (View Full Article)
• Drug Dissolution Studies with Atomic Force Microscopy (AN77) (Lab and Test Equipment)
  From this Article:

  The ability of atomic force microscopy (AFM) to resolve structures on the nanometer-to-subangstrom scale in ambient and fluid environments has made it a particularly useful tool in pharmaceutical... (View Full Article)
• Drug Interactions Investigated Using AFM with Functional Tips (AN110) (Lab and Test Equipment)
  From this Article:

  Current antibacterial drugs might become ineffective in the near future due to a phenomenon called pharmacoresistance. This refers to the ability of microorganisms to withstand bacteriocidal (cell... (View Full Article)
• Electric Force Microscopy, Surface Potential Imaging, and Surface Electric Modification with the Atomic Force Microscope (AN27) (Lab and Test Equipment)
  From this Article:

  Electric Force Microscopy (EFM) and Surface Potential (SP) imaging are two AFM techniques, which characterize materials for electrical properties. A conductive AFM tip interacts with the sample... (View Full Article)
• Electrical Characterization with Scanning Probe Microscopes (AN79) (Lab and Test Equipment)
  From this Article:

  The ongoing evolution of scanning probe microscopy has yielded analytical instruments featuring numerous capabilities for a wide range of applications. The ability of these instruments to perform... (View Full Article)
• Force Modulation Imaging (AN01) (Machine Vision Equipment)
  From this Article:

  Force modulation imaging is an atomic force microscopy (AFM) technique that identifies and maps differences in surface stiffness or elasticity1. It is one of several techniques developed as extensions... (View Full Article)
• Force Resolution in Force Spectroscopy Experiments: Thermal Noise and Bandwidth (AN104) (Lab and Test Equipment)
  From this Article:

  By limiting the bandwidth in any of average. This can be implemented in INFLUENCE OF THE MEASUREMENT these ways it is possible to exclude two different ways. First, the ramp rate BANDWIDTH a portion... (View Full Article)
• Force Spectroscopy and Local Mechanical Properties with diCaliber (AN101) (Lab and Test Equipment)
  From this Article:

  The ability of atomic force microscopy (AFM) to create three-dimensional micrographs with nanometer resolution has made it an essential tool in applications ranging from semiconductor processing to... (View Full Article)
• Geometric Considerations of Surface Profilers and Pivoting Step Measurers (AN518) (Inspection Tools and Instruments)
  From this Article:

  In recent years, stylus-based surface measuring instruments have broadened in application to become among the most widely used general purpose instruments in advanced R&D and manufacturing. These... (View Full Article)
• Getting in Touch with Biomaterials (Lab and Test Equipment)
  From this Article:

  Biomaterials are used in devices that interact with biological systems, usually in medical applications. They can be synthetic (metals, polymers, ceramics) or modified natural materials (collagen,... (View Full Article)
• Greater Measurements Detail with High-Definition Vertical Scanning Interferometry (Calibration and Testing Services)
  From this Article:

  Optical profilers are specialized interference microscopes that utilize the interference of two beams of light for characterizing surface topographies. For decades, Veeco has been the world's leading... (View Full Article)
• HarmoniX Microscopy for Materials Characterization Drug Interactions Investigated Using AFM with Functionalized Tips (AN112) (Lab and Test Equipment)
  From this Article:

  For some time now, the AFM has been used to characterize material properties. Beginning with force curves, force volume, and nanoindenting, and progressing to force modulation and phase imaging,... (View Full Article)
• High Speed Surface Measurement with Lateral Scanning White Light Interferometry (Calibration and Testing Services)
  From this Article:

  White light interferometry is a well-established technique for quickly determining three-dimensional surface shape over large areas. Systems employing this technique can measure areas as large as the... (View Full Article)
• Impressions of the International Meeting on AFM in Biology and Medicine (Lab and Test Equipment)
  From this Article:

  Atomic force microscopy (AFM) is gaining recognition as a powerful tool for life science researchers wanting nanoscale imaging and manipulation to study cells, molecules, and forces. At the first AFM... (View Full Article)
• Improving Gauge Capability for High-Speed Process Control (AN515) (Desktop Personal Computers)
  From this Article:

  In the data storage industry, hard drives manufacturers maintain high-volume, 24/7 production, while holding nanometer-scale tolerances and meeting ever-decreasing price points. To achieve these... (View Full Article)
• Improving the Accuracy of AFM Measurements: The Thermal Tune Solution (AN90) (Lab and Test Equipment)
  From this Article:

  The atomic force microscope (AFM) is a sensitive force measurement instrument. But sensitivity and measurement accuracy are two different issues. This application note describes a solution for... (View Full Article)
• In Line Monitoring of Shallow Trench Isolation Divot Depth (Machine Vision Equipment)
  From this Article:

  Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at 65nm nodes and below. Measurement precision, and accuracy are foundational to the AFM including the... (View Full Article)
• In-Line Monitoring of Cu Dual-Damascene Etch Processes (Calibration and Testing Services)
  From this Article:

  Dual-damascene methodology has dramatically reduced complexity and shortened real process times over traditional metal etch and fill methods. However, the improved technique introduces new issues in... (View Full Article)
• In-Line Monitoring of Shallow Trench Isolation Etch Depth (Machine Vision Equipment)
  From this Article:

  This application note highlights the issues with Shallow Trench Isolation (STI) etch metrology, current metrology techniques and the benefits of Atomic Force Microscopy (AFM) for characterization and... (View Full Article)
• Interferometry Technology Overview (Calibration and Testing Services)
  From this Article:

  In its most common application interferometry is a versatile measurement technology for examining surface topography with very high precision. At the heart of interferometry is the interferogram,... (View Full Article)
• Large Field of View, High Spatial Resolution Surface Measurements (Calibration and Testing Services)
  From this Article:

  It is difficult in interferometric metrology to maintain high spatial resolution over a large field of view. Interferometric microscope measurements yield high resolution, but only over a small area.... (View Full Article)
• Lateral and Chemical Force Microscopy: Mapping Surface Friction and Adhesion (AN05) (Lab and Test Equipment)
  From this Article:

  Lateral Force Microscopy (LFM) is a scanning probe microscopy (SPM) technique that identifies and maps relative differences in surface frictional characteristics. Applied with contact mode atomic... (View Full Article)
• Measuring Micro-Lens Radius of Curvature with a White Light Optical Profiler (Calibration and Testing Services)
  From this Article:

  Microlenses are discrete or array-based spheres, aspheres and other optics used in a variety of applications, chiefly for focusing light into fibers for optical networking. Microlenses are typically... (View Full Article)
• MEMS in Motion: a New Method for Dynamic MEMS Metrology (AN514) (Lab and Test Equipment)
  From this Article:

  Manufacturers of MicroElectroMechanical Systems (MEMS) rely on metrology to control their processes and to verify how their products will perform once they are packaged and in service. Since the... (View Full Article)
• Minimizing Dishing and Erosion in Copper CMP: In-Line Monitoring with the Dimension Vx Atomic Force Profiler (Inspection Tools and Instruments)
  From this Article:

  Dishing and erosion, which together account for nearly 50 percent of yield losses in copper processing, are the most important effects to minimize in the copper chemical mechanical polishing (CMP)... (View Full Article)
• Modern Trends in AFM of Polymers (AN84) (Lab and Test Equipment)
  From this Article:

  Initially introduced as an accessory to scanning tunneling microscopy (STM), atomic force microscopy (AFM) has become an advanced and most valuable scanning probe technique broadly used in academic... (View Full Article)
• Nanoindentation, Scratching and Wear Testing Using Scanning Probe Microscopy (AN13) (Calibration and Testing Services)
  From this Article:

  Nanoindentation is an option for Digital Instruments MultiMode® and Dimension™ Series Scanning Probe Microscopes (SPMs). Using TappingMode™ AFM and an AFM diamond tip mounted to a... (View Full Article)
• NanoScope Software Tools for Force Spectroscopy Data Analysis (AN97) (Lab and Test Equipment)
  From this Article:

  The atomic force microscope (AFM) offers extraordinarily high resolution in force measurement applications, routinely yielding useful data down to the thermal noise floor of the cantilever, typically... (View Full Article)
• Optical Profiler Analysis of Cutting Tool Wear During High Speed Machining (Calibration and Testing Services)
  From this Article:

  High speed machining not only saves manufacturing time and obviates certain finishing steps, but it also helps to produce parts with higher strength. The need to machine parts faster has lead to the... (View Full Article)
• Optical Profiling Enable High Volume Stent Manufacturing (Calibration and Testing Services)
  From this Article:

  Stents have revolutionized treatment for atherosclerosis by reducing the possibility of narrowing of the artery after it is treated. These small stainless steel mesh tubes are designed for insertion... (View Full Article)
• Optical Profiling Improves Print Quality Control (ANROLL1) (Machine Vision Equipment)
  From this Article:

  Anilox and gravure printers and roll manufacturers have standardized white light optical profiling for volume measurements on new printing rollers and wear inspection of used rollers. In use... (View Full Article)
• Optical Profiling Provides Comprehensive Metrology for Stent Coatings (Industrial Coatings and Sealants)
  From this Article:

  Balloon angioplasty and stent placement has drastically reduced the need for major surgery and its associated risks, making it the preferred means of treating heart ailments and other corporal vessel... (View Full Article)
• Optical Profiling Techniques for Characterizing Free-Form Optics (Calibration and Testing Services)
  From this Article:

  Optics that deviate from the traditional spherical shape are increasingly popular in optical designs because of their superior image quality, reduced cost, and smaller space requirements. The... (View Full Article)
• Phase Imaging of Polymer Materials with Caliber (AN103) (Lab and Test Equipment)
  From this Article:

  TappingModeTM imaging has proved to be the most versatile mode of atomic force microscopy (AFM) in ambient conditions where the presence of a fluid layer (condensed water vapor and other contaminants)... (View Full Article)
• Phase Imaging: Beyond Topography (AN11) (Machine Vision Equipment)
  From this Article:

  Phase Imaging is a powerful extension of TappingMode™ Atomic Force Microscopy (AFM) that provides nanometer-scale information about surface structure and properties often not revealed by other... (View Full Article)
• Practical Advice on the Determinaton of Cantilever Spring Constants (AN94) (Lab and Test Equipment)
  From this Article:

  Atomic force microscopy (AFM) is being used in a great variety of force measurement applications, including investigating the unfolding pathways of native membrane proteins2, probing the structure of... (View Full Article)
• Precision Surface Metrology Enables Solar Efficiency Gains (Vacuum Equipment)
  From this Article:

  The solar energy industry is experiencing rapid growth due to many factors, including record oil prices and the worldwide desire to reduce greenhouse gas emissions. World energy consumption is... (View Full Article)
• Probing DNA-Protein Interactions with AFM (AN89) (Lab and Test Equipment)
  From this Article:

  Large, multi-component protein assemblies are involved in many DNA transactions such as recombination, replication, transcription, and repair. In order to progress in the understanding of different... (View Full Article)
• Probing Nano-Scale Forces with the Atomic Force Microscope (AN08) (Lab and Test Equipment)
  From this Article:

  The ability of the atomic force microscope (AFM) to create three-dimensional micrographs with resolution down to the nanometer and Angstrom scales has made it an essential tool for imaging surfaces in... (View Full Article)
• Quantifying Laser-Induced Thermal Deformation of a MEMS Device Static and Dynamic Optical Profiling Characterize Heating-Cooling Cycle (Calibration and Testing Services)
  From this Article:

  Certain MicroElectroMechanical Systems (MEMS), such as high power optical switches and beam steering devices, must be able to withstand high optical power density without permanent damage or loss of... (View Full Article)
• Quantitative Assessment of the Ordering of Collagen Fibrils on a Native Bone Surface Using Large-Scan and High-Resolution AFM (AN96) (Lab and Test Equipment)
  From this Article:

  Bone is a biological composite with extraordinary mechanical strength, and toughness relative to its density. It provides our bodies with the skeletal stability as well as load carrying capacity. Yet... (View Full Article)
• Reactive Ion Beam Etching of InP (Optoelectronics)
  From this Article:

  A variety of optoelectronic devices are fabricated using compound semiconductors. In order to implement large-scale manufacturing using these materials, new processing techniques must be developed.... (View Full Article)
• Replacing Cross-Section SEMs with the Dimension X3D AFM for Sensitive 193nm Photoresist Metrology (Machine Vision Equipment)
  From this Article:

  Cross-section SEMs and FIB (focus ion beam) SEMs, long used for characterizing advanced photoresist processes, are no longer capable of providing sufficient information for today's highly refined... (View Full Article)
• Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complimentary Techniques for High Resolution Surface Investigations (AN46) (Lab and Test Equipment)
  From this Article:

  There are a wide range of analytical techniques which may be used for materials characterization depending on the type of information needed. For high resolution surface investigations, two commonly... (View Full Article)
• Scanning Probe/Atomic Force Microscopy: A Technology Overview (AN48) (Lab and Test Equipment)
  From this Article:

  Scanning probe microscopes (SPMs) are instruments that measure properties of surfaces. They include atomic force microscopes (AFMs) and scanning tunneling microscopes (STMs). In their first... (View Full Article)
• Scanning Tunneling Microscopy: A tool for Studing Self-Assembly and Model Systems for Molecular Devices (AN85) (Lab and Test Equipment)
  From this Article:

  The invention of the scanning tunneling microscope in 1982 initiated the creation of what is known today as a whole family of scanning probe microscopies (SPMs). The importance of scanning tunneling... (View Full Article)
• Stress Measurement Calculations of Thin Film Layer Deposition on Wafers Using Dektak Stylus Profilers (Calibration and Testing Services)
  From this Article:

  Film deposition and planarization processes employed in the manufacture of semiconductors, MEMS, thin film filters and other devices, generate stress in both the substrate and the deposited film.... (View Full Article)
• Studies of Metallic Surfaces and Microstructures with Atomic Force Microscopy (AN28) (Lab and Test Equipment)
  From this Article:

  Atomic Force Microscopy (AFM) is capable of generating 3D images of surface topography with nanometer and Ångstrom resolution. This powerful technology allows material scientists new insight into the... (View Full Article)
• Surface Measurement Parameters for Wyko Optical Profilers (AN505) (Lab and Test Equipment)
  From this Article:

  R Parameters were originally developed for two-dimensional, stylus type profiling applications. Many of these statistics were later adapted for three-dimensional use as well, for systems such as... (View Full Article)
• Surface Texture Analysis Using Dektak Stylus Profilers (Calibration and Testing Services)
  From this Article:

  "Surface texture" refers to the local deviations of a surface from its "ideal" shape. Accurate characterization of surface texture is critical for controlling the function and reliability of precision... (View Full Article)
• TappingMode & Phase Imaging Study of a Multi-Component (AN302) (Lab and Test Equipment)
  From this Article:

  The AFM is a microscope without lenses that operates by the physical interaction between a mechanical stylus-probe and the sample surface. Using TappingMode™, an AFM can not only image... (View Full Article)
• TappingMode AFM Imaging in Fluids for the Study of Colloidal Particle Adsorption (AN09) (Lab and Test Equipment)
  From this Article:

  The ability to image solid surfaces in a liquid medium makes atomic force microscopy (AFM) an attractive tool in the study of liquid-solid interfacial phenomena. One such area of research where AFM... (View Full Article)
• TappingMode Atomic Force Microscopy: Operation in Fluid (AN49) (Lab and Test Equipment)
  From this Article:

  Many of the biological samples suitable for imaging with atomic force microscopy (AFM) are subject to artifacts if they are dried. This problem is not unique to AFM imaging. It has long been a concern... (View Full Article)
• TappingMode Imaging Applications and Technology (AN04) (Machine Vision Equipment)
  From this Article:

  TappingMode™ imaging is a key advance in atomic force microscopy (AFM). This patented technique allows high resolution topographic imaging of sample surfaces including on surfaces that are... (View Full Article)
• Tip Characterization and Surface Reconstruction of Complex Structures (Machine Vision Equipment)
  From this Article:

  Diminishing feature size, combined with requirements for higher throughput during quality control, have steadily increased demand for Critical Dimension Atomic Force Microscopy (CD AFM). In contrast... (View Full Article)
• Tip Evaluation Option for NanoScope Atomic Force Microscopes (AN24) (Lab and Test Equipment)
  From this Article:

  AFM measurements are limited by the shape of the tip used to probe the sample surface. As the tip wears, the finite size of the AFM tip may not allow the tip to accurately probe narrow or sharp... (View Full Article)
• Torsional Ressonance Tunneling (TR TUNA) AN107 (Lab and Test Equipment)
  From this Article:

  ® The implementation of a torsional drive TUNA can be applied to many research cycle in a regime having no near-fi eld system for use with AFMs from Veeco or manufacturing areas on a wide... (View Full Article)
• Triple DAC Configuration in NanoScope Controllers, Superior Control, Resolution, and Flexibility (AN23) (Lab and Test Equipment)
  From this Article:

  The system controller is a critical component of any Scanning Probe Microscopy (SPM) system. Digital Instruments NanoScope Controllers have set the industry standard since its inception over a decade... (View Full Article)
• Understanding the Importance of CD Reference Metrology for 45nm & 32nm Technology Nodes (AN116) (Machine Vision Equipment)
  From this Article:

  As 45nm is introduced into production and 32nm node is in extensive development there is an an increasing need for accurate CD metrology in both process development and in-line manufacturing control.... (View Full Article)
• Using AFM in Pharmaceutical Studies of Drug Crystal Growth, Particles, and Coatings (AN63) (Lab and Test Equipment)
  From this Article:

  Microscopic evaluation is important for the design and evaluation of a pharmaceutical product after the steps in the drug formulation process. Since atomic force microscopy (AFM) provides the ability... (View Full Article)
• Using Atomic Force Microscopy for Engineering Low Scatter Thin Film Optics (AN21) (Lab and Test Equipment)
  From this Article:

  The quality of optical components used in complex applications such as lasers, microscopes, and lithography systems, is critically influenced by surface morphology. The majority of these components -... (View Full Article)
• Using Atomic Force Microscopy to Control and Enhance Structural and Optical Properties of GaN-based Light Emitting Diodes Grown by MOCVD (AN80) (Lab and Test Equipment)
  From this Article:

  Red and yellow light emitting diodes (LEDs) fabricated from compound semiconductors (GaP and InGaAlP) have long been used in many display applications from automobiles to microwave ovens. The benefit... (View Full Article)
• Using the Dimension X3D AFM in Advanced Photomask Metrology (Machine Vision Equipment)
  From this Article:

  The photomask industry is being challenged as never before; "mask makers' holidays" are a thing of the past. New materials with smaller structures demand innovative ways to address the metrology and... (View Full Article)