The VectorStar ME7838 broadband series system from Anritsu sets a new standard for performance and usability in millimeter-wave (mmWave) measurements. Leveraging Anritsu's Nonlinear Transmission Line (NLTL) technology, the ME7838 series delivers exceptional performance within a compact mmWave module.

Key features of the ME7838 series include:

Unmatched Frequency Coverage: The system offers industry-leading coverage, ranging from 70 kHz to 110 GHz, 125 GHz, 145 GHz, and even reaching 220 GHz.
Enhanced Calibration Stability: The ME7838 series is the only broadband system with positive raw directivity across multiple bands. This translates to superior calibration and measurement stability, significantly reducing calibration frequency and allowing for more time dedicated to actual measurements.
Exceptional Dynamic Range: The ME7838 VNA series boasts a high dynamic range of 109 dB at 110 GHz and 102 dB at 220 GHz. This, combined with excellent noise floor performance, ensures accurate and reliable measurements across the entire sweep range.
Focus on On-Wafer Measurements:

The VectorStar ME7838G VNA specifically addresses the growing demand for on-wafer characterization extending into the sub-Terahertz region. This innovative system offers unparalleled broadband coverage, reaching from 70 kHz to a staggering 220 GHz in a single sweep. Optimized for on-wafer measurements, it seamlessly integrates with the MPI TITAN T220 probe. This unique design eliminates the limitations of threaded connectors by allowing the 220 GHz probe to connect directly to the mmWave module, ensuring accurate and stable on-wafer measurements.

Beyond VNAs: Spectrum Analyzer Option:

The ME7838 series goes beyond traditional VNAs by offering the world's first single-sweep spectrum analyzer option. This option unlocks spectral domain measurements, enabling analysis of parameters like harmonics, spurs, distortion products, and overall frequency content across various devices.

In conclusion, the Anritsu VectorStar ME7838 broadband series system caters to a wide range of applications demanding exceptional performance in mmWave measurements. Its industry-leading frequency coverage, enhanced calibration stability, and focus on on-wafer capabilities make it a compelling choice for engineers and technicians working on cutting-edge technologies. The additional spectrum analyzer option further expands its functionality, providing a versatile solution for diverse testing needs.