Micross’ High-Performance and Standard-Performance Nuclear Event Detectors (NEDs) provide functional replacements for 40-year old legacy NED device, while providing higher sensitivity and reduced response times. Micross also continues production of its First Generation (Technograph) NED device.

The High-Performance and Standard-Performance NEDs provide up to 4x greater sensitivity and reduced delay times at 5x lower overdrive ratios than legacy NEDs. They also feature integrated differential drivers and receivers providing improved overall noise immunity;  size, weight and power (SWaP) optimization, and additional response time improvements. Legacy NED devices require external differential drivers and receivers, which typically increases size and weight due to additional radiation shielding requirements, and further increase response times by up to 100%.

The High-Performance NED offers 300% greater radiation dose sensitivity, and 25% faster response times at 5x lower overdrive ratios relative to legacy NEDs. They come in 44-pin hermetic ceramic packages and can be screened to XT (Extended Temperature, -55 to 125 °C) or to MIL-PRF-38534 Class K.

The Standard-Performance NED offers 100% greater radiation dose sensitivity, and faster response times at 5x lower overdrive ratios relative to legacy NEDs. They come in 44-pin non-hermetic ceramic packages and are screened to XT (Extended Temperature, -55 to 125 °C) or to MIL-PRF-38534 Class H.

The First Generation NED provides a cost-effective solution for providing nuclear hardening for legacy or new equipment. In response to a nuclear event, it provides a single-ended open collector output signal.

Customized NEDs can be optimized for the fastest response time, highest sensitivity, broadest dynamic range, reduced size and weight, or the most optimal combination of these features to address your specific requirements.