The webinar shows how time and resources can be saved thanks to autonomous test and inspection. The audience will receive compact information about the functions of test and inspection systems that avoid fault slippage as well as for minimizing pseudo errors when used in the manufacturing process. Ways to minimize the risk of misclassification through the use of artificial intelligence will be demonstrated.
Overview
Errors can creep in not only in the manufacturing process of electronic assemblies but also impact the effectiveness of quality control and the correct verification of detected errors.
The webinar will demonstrate functions of test and inspection systems that virtually eliminate fault slippage and minimize false rejects.
Based on optimal data, the risk that comes with manual parameterization can be automated as far as possible through AI-based functions. Similarly, the supervised adjustment of parameters of an AOI program provides the basis for a safe inspection. Finally, the manual influence in the verification and classification of results can be eliminated by autonomous monitoring functions.
In the field of embedded JTAG solutions, autonomous test solutions are also gaining ground in various ways including the following challenge in test program generation: the elements from the CAD data, such as devices, pins and nets, have neither information about the associated class nor a model, which describes their internal functioning.
This is where AI is used: Modules as well as networks are classified and suggested to the user through a learned model, which analyzes the structure of the elements and their connections to each other. The search for a suitable library entry is also improved by neural networks.
The goal of 100% test coverage is coming closer.
Key Takeaways
- Learn how autonomous testing and inspection can save your resources
- Find out more about the most common hidden solder joint failures
- See how false rejects and fault slippage can be kept in balance
Speaker
Whetstone has more than 35 years of experience in test engineering, applications engineering and technical sales and marketing in the semiconductor and board test industries. For the last 11 years, David Whetstone has been focused on expanding the market in the U.S. for GOEPEL’S innovative, industry leading AXI and AOI inspection technologies as well as their JTAG based embedded electrical test technologies.