OLED and microLED display technologies present new quality challenges for manufacturers because each pixel is its own individual emitter, which can exhibit wide variance in luminance and color (called mura). New display metrology methods are required to measure and correct (demura) emissive displays to ensure product quality and increase yields.
Overview
Display metrology is the scientific quantification of values of light that enables evaluation of the visual qualities of a display, from brightness to color to contrast, according to how they are perceived by a standard human observer. OLED, microLED and other emissive display technologies present new measurement challenges for manufacturers. They are called “emissive” because each pixel of the display is its own individual emitter (in contrast to traditional LCD displays where a liquid crystal panel is illuminated by a backlight of LEDs). Each emitter can exhibit a wide range of luminance and color. Because the LEDs are not “blended” behind an LCD panel, the display may appear uneven to a viewer (called mura).
To correct mura and ensure a uniform appearance, each pixel of the display must be measured accurately so a correction factor can be applied. This correction process is called demura. Each pixel and subpixel element may be as small as microns — or tens of microns in the case of microLEDs — posing a new set of challenges for display metrology.
In this presentation from Radiant Vision Systems, Chris Williamson, Regional Sales Manager, will discuss emissive displays and explore the quality challenges they pose. He will describe various display measurement approaches that can be used to measure OLED and microLED displays. This webinar will explain how demura (correction) of emissive displays can be accomplished, enabling panel, display, and device manufacturers to improve quality and increase yields.
Key Takeaways
- Understand display quality challenges of newer OLED, microLED, and other emissive displays
- Examine how new display metrology methods can detect mura (blemishes) at the individual pixel and subpixel level of OLED and microLED
- Learn the process of demura (correction) of emissive display defects and see examples of advanced metrology systems with advantages for demura
Speaker
Williamson directly supports global customers on Radiant’s sales team, where he works across application and product groups toward the implementation of solutions that meet unique challenges in display and light measurement. He has traveled throughout North America, Asia, and Europe, joining engineers and manufacturers directly in their facilities to understand how Radiant solutions can meet needs in the field. Williamson has an in-depth knowledge of adapting the Radiant product suite to address new and demanding inspection applications.