The demand for extended reality (XR) devices is accelerating, bringing new inspection challenges to manufacturers that exceed the capabilities of some traditional display metrology systems. To maintain high performance and product reliability, manufactures must adapt to these optics while ensuring quality benchmarks are achieved. This webinar will discuss methods used to measure XR devices with these considerations including an innovative and optimized method for production testing.
Overview
While the market for AR/VR/MR devices continues to increase, manufactures remain confronted with obstacles that some current inspection methods are unable to address. Requirements of XR display manufactures include measuring luminance and color accurately across the full field of view, inspecting waveguides, characterization of MTF quality, measuring virtual image distance, and replicating human visual perception.
Some of these requirements exceed the capabilities of traditional display metrology systems. When evaluating luminance and color across the full field of view of an XR display, distortion from the lens is contributed, curved focus planes result in a non-uniform MTF, and multiple measurements are required, resulting in slower system takt times. Replicating human visual perception produces another challenge as an aperture that is similar in size to the human pupil is required when capturing measurements and systems must accommodate a range of diopters for accurate results when compensating for prescription optics.
When considering the requirements for measuring the quality of XR devices, manufacturers must consider these optics while assessing key visual performance characteristics such as MTF, uniformity, and distortion. In this webinar, we'll discuss the measurement requirements and challenges of XR displays while exploring a solution that ensures quality, accuracy, and efficiency when evaluating AR/VR/MR displays.
Key Takeaways
- Review the measurement requirements of AR/VR/MR displays
- Identify the challenges of current inspection methods, such as lens focus and distortion, lens size, and prescription compensation for XR devices and applications.
- Discuss a new solution that ensures quality and efficiency for XR device manufacturers.
Speaker
Mike Caputo works with leading brands in consumer electronics, augmented and virtual reality, and emerging devices, supporting developers and manufacturers with advanced metrology solutions for optical design and sensing. He applies a background in automated visual inspection, coming from 10 years in the machine vision field. His experience spans the electronics, aerospace, medical device, and packaging industries, where he has helped companies to meet a range of quality and production challenges by applying automated measurement and inspection solutions. Caputo earned a Bachelor of Science degree in electrical engineering from the University of Cincinnati.