Modern data centers face growing contamination risks as power densities increase as well as their reliance on liquid cooling architectures. This webinar shows how airborne and liquid particle monitoring can be used as a continuous diagnostic and early warning tool, helping identify developing issues before they impact reliability, cooling performance, or uptime. Learn practical strategies to apply proven monitoring concepts from cleanroom industries to real-world data center environments.
Overview
Modern data centers are operating at unprecedented power densities, with tighter thermal margins and increasing reliance on liquid cooling architectures. While most data centers are not designed or certified as ISO classified cleanrooms, particulate contamination—both airborne and liquid borne—remains a critical and often under recognized risk to system reliability, cooling efficiency, and uptime.
This webinar explores how particle monitoring, long established in cleanroom and high purity manufacturing environments, can be practically applied in data centers—not as a certification exercise, but as a continuous diagnostic and early warning tool. On the airborne side, we will discuss how localized particle monitoring can reveal developing failure points such as fan degradation, airflow imbalance, filter loading, construction activity, or maintenance induced contamination long before these issues escalate into equipment faults or outages. While ISO Class 8 certification will be briefly addressed for those facilities that pursue formal classification, the primary focus is on using airborne particle data to identify trends, correlate events, and guide corrective action in real world data center environments.
The webinar will also address particulate contamination in liquid cooling systems, including direct to chip and closed loop architectures. As cooling channels, pumps, seals, and heat exchangers become smaller and more sensitive, even modest particle loads can restrict flow, accelerate wear, and reduce thermal performance. We will examine how continuous and portable liquid particle monitoring can be used during commissioning, normal operation, and troubleshooting to detect wear debris, maintenance contamination, and early signs of system degradation.
Throughout the session, practical monitoring strategies will be presented along with examples of airborne and liquid particle counters suitable for data center deployment. Attendees will gain a clear understanding of where to monitor, what trends matter, and how particle data can be used to prevent contamination driven failures rather than simply reacting to them.
Key Takeaways
- Learn how airborne particle monitoring can uncover early signs of airflow imbalance, equipment degradation, and maintenance-related risks
- Examine how continuous and portable liquid particle monitoring can be used to detect early signs of system degradation
- Understand where to monitor, what trends matter, how to use particle data to prevent contamination
- Review the particle limit classifications of ISO Class 8 Certification
Speakers
With a background in chemical engineering and hands-on experience in the semiconductor and microelectronics industries, Benton Hutchinson helps manufacturers improve contamination control. He is an expert in detecting and reducing airborne molecular contamination and particle levels in critical environments, supporting high-yield production and cleanroom compliance. He has delivered technical training and presentations on cleanroom contamination topics around the world. Hutchinson holds both a Bachelor’s and a Master’s degree in Chemical Engineering. At Particle Measuring Systems, he supports global innovation in cleanroom monitoring.
Richard Duskey brings over eight years of experience across service, technical support, metrology, and product management, following a prior technical role in the military. His work spans both life sciences and electronics sectors, with an emphasis on environmental monitoring systems, cleanroom data integrity, and system integration. Duskey also serves as an educator through Particle College, delivering practical training on particle counters, system performance, and regulatory compliance. At Particle Measuring Systems, he helps advance cleanroom monitoring technologies that support yield improvement and process control for high-tech manufacturing environments.