Jared McGladdery, CMT’s Director of Business Development (EMEA) shares his insights from European Microwave Week, discussing the latest innovations in mmWave measurement, the growing role of compact 4-port VNAs, and how embedded VNA technology is expanding into new applications beyond the traditional RF laboratory.
Overview
What happens when RF measurement technology is designed around the challenges engineers actually face? In this webinar, Copper Mountain Technologies takes a closer look at the ideas and technologies shaping the future of microwave measurement, from making mmWave testing more accessible to expanding the possibilities of multiport and embedded VNA solutions.
The webinar explores a new approach to frequency extension that makes mmWave measurements more accessible and changes the economics of building high-frequency test systems. Explore the growing role of compact 4-port VNAs in complex device characterization, including multiport components and differential measurements, and the demand for greater flexibility in modern RF test environments. The webinar also looks at how VNA technology is moving beyond the traditional RF laboratory, becoming an embedded measurement engine for applications in communications, defense, industrial sensing, medical research, material characterization, and other emerging fields.
Explore what truly matters when measurement accuracy and confidence are critical. With perspectives from European Microwave Week and examples spanning communications, defense, industrial sensing, medical applications, and research, this webinar offers a look at how practical innovation is making advanced RF measurements more accessible, flexible, and useful in the real world.
Key Takeaways
- Discover how a new approach to frequency extension eliminates the need to dedicate a full VNA to drive mmWave extenders, making high-frequency measurement systems more accessible and cost-effective.
- Explore how compact 4-port VNAs support complex device characterization, including multiport and differential measurements, while meeting the growing need for flexible RF test solutions.
- Learn how embedded VNA technology is moving beyond the RF lab and expanding into communications, defense, industrial sensing, medical research, material characterization, and other emerging applications
Speaker
Jared McGladdery has over 25 years in RF and Microwave and Test and Measurement industries. He held positions in Marketing and Sales for companies such as Racal, Agilent, and LeCroy. Working in many industrial sectors, he has supported and sold hardware platforms as well as software licenses and services. Jared has worked in direct sales across the EMEA region and has managed distribution partners in India and Asia. Working in business sectors such as Mobile Telecoms and test services and after spending some years at UL, Jared joined Copper Mountain Technologies as Director of Business Development for EMEA in February of 2020.