Benchtop XRF Analyzer

Description: The new EA1400 benchtop XRF analyzer has speed, accuracy and versatility at its core. With an ultra-sensitive SDD detector, large sample chamber and optimized X-ray detector arrangement, it can be used for a range of applications and is ideal for RoHS regulatory screening. Rapid

• Analysis Method / Detection Technology: Specialty / Other
• Elements Analyzed: Metal / Metalloid, Other
• Solid Samples: Yes
• Test Media: Ferrous Metal (Steel, Cast Iron), Inorganic Material, Nonferrous (Copper, Aluminum)

Description: XRF analysis with the X-Supreme 8000 for quality assurance and process control requirements Analysis can be performed on a wide range of sample types including solids, liquids, powders, pastes, films, etc., from ppm to high %, covering elements Na11 to U92 in the

• Form Factor: Bench / Rack / Cabinet
• Instrument / System Type: X-ray Generator / Source

Description: Specifically designed for RoHS (Restriction of Hazardous Substances) the EA1000AIII analyzers have been trusted for over 15 years to deliver consistent results for businesses who need to conform to this directive. With easy and quick measurement of hazardous substances you can ensure you will

• Analysis Method / Detection Technology: Specialty / Other
• Elements Analyzed: Metal / Metalloid, Other
• Liquid / Slurry Samples: Yes
• Solid Samples: Yes

Description: power and performance; our advanced 3-beam (kV-mA-filter settings) method and the latest in detector technology - an innovative, large area Silicon Drift Detector (SDD), used and tested extensively in high-end laboratory based instrumentation. Use it as your primary XRF analyzer, your

• Form Factor: Portable / Hand Held / Mobile
• Instrument / System Type: X-ray Generator / Source
• Programmable / Digital Control Unit: Yes

Description: The FT200 Series benchtop XRF analyzers have been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a series of ground-breaking

• Form Factor: Bench / Rack / Cabinet
• Instrument / System Type: Other

Description: The BTX Benchtop X-ray Diffraction/X-ray Fluorescence is, simply put, the first combined XRD/XRF instrument designed with ease of use in mind. From educational settings, to the rigors of a QC application, BTX is well suited. Based on the filed proven reliable design of Terra, our field

• Form Factor: Monitoring System
• Instrument Type: Other
• Technology: Radiographic / X-ray