Wafer and Thin Film Instrumentation Suppliers in Aix En Provence Cedex 3, France

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
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Sciences et Techniques Industrielles de la Lumière (STIL)
Address: 595, rue Pierre Berthier - Domaine de Saint Hilaire, Aix en Provence CEDEX 3, Bouches-du-Rhône 13855 France
Business Type: Manufacturer

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