Wafer and Thin Film Instrumentation Suppliers in Nailsea, United Kingdom

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
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Metryx, Ltd.
Address: Manor Park Nailsea Wall Lane, Nailsea, Somerset BS48 4DD United Kingdom
Business Type: Manufacturer

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