Wafer and Thin Film Instrumentation Suppliers in Vista, California

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
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Machine Vision Products, Inc.
Address: 3270 Corporate View, Suite D, Vista, CA 92081 United States
Business Type: Manufacturer

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