Wafer and Thin Film Instrumentation Suppliers in Niwot, Colorado

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
Particle Measuring Systems
Address: 7477 E Dry Creek Parkway, Niwot, CO 80503 United States
Business Type: Manufacturer
Description: Particle Measuring Systems (PMS) sets the standard for contamination monitoring. With more than 60 patents, we create the technology that enables you to make fact-based decisions, improve process yield and comply with changing regulatory requirements. We understand the challenges our... (more)

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