Wafer and Thin Film Instrumentation Suppliers in Brighton, Michigan

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
Nikon Metrology, Inc.
Address: 12701 Grand River Rd., Brighton, MI 48116 United States
Business Type: Manufacturer
Description: Nikon Metrology, a wholly-owned subsidiary of NIKON CORPORATION, offers the broadest range of metrology solutions for applications ranging from micromechanics and electronics to the largest aircraft. Nikon Metrology’s innovative measuring and precision instruments include state-of-the-art... (more)

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