Wafer and Thin Film Instrumentation Suppliers in Pennington, New Jersey

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
Metricon Corporation
Address: 12 North Main Street, Pennington, NJ 08534 United States
Business Type: Manufacturer
Description: Since Metricon introduced its first prism coupling system in 1980, more than a thousand systems have been sold to top universities, research labs and companies in more than 40 countries. Compared to instruments based on optical interference, ellipsometry, or Abbe refractometry, the 2010/M's prism... (more)

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