Wafer and Thin Film Instrumentation Suppliers in Melville, New York

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
See suppliers in United States
Find Wafer and Thin Film Instrumentation by state
 
Morrell Instrument Company Inc.
Address: 502 Walt Whitman Rd., Melville, NY 11747 United States
Business Type: Manufacturer, Distributor

Products