Wafer and Thin Film Instrumentation Suppliers in Spring Valley, New York

Instruments such as quartz crystal microbalance (QCM) monitors, ellipsometers, RHEED systems, imaging stations, CD-SEMs, ion mills, C-V systems specifically designed for wafer metrology or in-situ monitoring of thin film parameters during thin film or semiconductors wafer processing. (more)
Kratos Analytical Inc.
Address: 100 Red Schoolhouse Road, Building A, Spring Valley, NY 10977 United States
Business Type: Manufacturer
Description: For over 40 years, Kratos Analytical has provided state-of-the-art spectrometers for both surface and biochemical analysis, and we are committed to continuing with development of leading technologies. As we approach our fifth decade, Kratos Analytical is still dedicated to providing... (more)

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