Semiconductor Metrology Instruments Suppliers in Oregon

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
Find Semiconductor Metrology Instruments by city
 
Cascade Microtech, Inc.
Address: 2430 NW 206th Avenue, Beaverton, OR 97006 USA
Business Type: Manufacturer

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DWFritz Metrology
Address: 9600 SW Boeckman Road, Wilsonville, OR 97070 United States
Business Type: Manufacturer, Service
Description: DWFritz Metrology (a Sandvik company), manufactures ZeroTouch®, a family of non-contact, high-speed inspection products designed for in-line or near-line measurement processes for multiple industries, including automotive, aerospace, orthopedic, and more. In support of IoT and Industry... (more)

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Electro Scientific Industries, Inc.
Address: 13900 NW Science Park Drive, Portland, OR 97229-5497 United States
Business Type: Manufacturer
Description: ESI is a leading supplier of innovative, laser-based manufacturing solutions for the microtechnology industry. Our systems enable precise engineering and testing of micron to submicron features in semiconductors, LEDs, multi-layer ceramic capacitors (MLCCs), printed circuit boards (PCBs),... (more)

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FEI Company
Address: 5350 NE Dawson Creek Drive, Hillsboro, OR 97124 United States
Business Type: Manufacturer

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Miller Design & Equipment
Address: PO Box 5071, Bend, OR 97708-5071 United States
Business Type: Manufacturer

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Schmitt Industries, Inc. - OR
Address: 2765 Northwest Nicolai St., Portland, OR 97210-1818 United States
Business Type: Manufacturer, Service
Description: Schmitt Industries designs, manufactures and markets highly precise test, measurement and process control systems for a wide variety of applications. The Company was founded in 1987 after determining that there was no simple or reliable solution for in-process dynamic balancing of... (more)

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