Electronic Test Equipment News
From GlobalSpec - a leader in industrial and engineering product news and information.About this eNewsletter
Frequency:
12 issues/year
Description:
GlobalSpec's Electronic Test Equipment newsletter keeps subscribers up-to-date on the world of test and measurement technologies. It highlights the latest advancements in electronic test equipment, including oscilloscopes, spectrum analyzers, and signal generators, showcasing their applications across industries like electronics manufacturing, telecommunications, and research. Additional topics include emerging trends in test automation, 5G testing, and artificial intelligence-driven testing solutions, underscoring the importance of testing at every level of manufacturing.
Markets Served:
Electronic Device Manufacturing; Electronic Product Design; Assembly and Packaging
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Archives
Past Issues of this eNewsletter
Volume 21 -
Issue 5 -
05/22/2026
Beamwidth and directivity shape accurate RF and EMC antenna testing; High-speed RF power measurements in laboratory and manufacturing environments; The perfect DRG horn for immunity and emissions testing; Multi-purpose broadband noise module
Volume 21 -
Issue 4 -
04/24/2026
High-speed, wideband VNAs for automated testing; Boosting particle physics research with programmable power supplies; High quality RF, microwave and mmWave solutions
Volume 21 -
Issue 3 -
03/27/2026
RF power made simple: dBm to watts conversion tool; Transient EM/circuit co-simulation for TVS diodes; AK-40G kit: Complete, reliable compliance testing anywhere, anytime; Temperature and humidity chamber for PCB reliability testing
Volume 21 -
Issue 2 -
02/27/2026
On-demand webinar: Integrating HALT into the product development cycle; The future of powering AI — Redefining the power flow in and beyond AI data centers; RIGOL DHO/MHO5000 high-resolution oscilloscopes — up to 1 GHz; Compact electronic vibration test platform
Volume 21 -
Issue 1 -
01/23/2026
How electrification is changing aircraft testing; How to build successful switching systems for mission-critical test applications; 2-way MLDD power divider covers 7.125 to 15.35 GHz
Volume 20 -
Issue 12 -
12/26/2025
How to build successful switching systems for mission-critical test applications; The invisible importance of precision optical coatings
Volume 20 -
Issue 11 -
11/28/2025
Keep machines up when power goes down; How to build successful switching systems for mission-critical test applications; Oscilloscopes for high channel and power electronics applications; Measuring temperature of the smallest, complex structures of components; Want faster, smarter R&D?
Volume 20 -
Issue 10 -
10/24/2025
How electrification is changing aircraft testing; 4x4 Butler matrix covers 2.4 to 7.25 GHz (S- and C-Bands); Mini vibration test systems: Benchmark performance for R&D; CT scanning is revolutionizing electronics QA/QC; Performance arbitrary waveform generators
Volume 20 -
Issue 9 -
09/26/2025
dBm, volts, watts conversion; SEPIC topology for DC/DC converters with coupled and uncoupled inductors; Real-time portable signal analysis; Reliable quality and process control through IR temperature measurements; Highly precise anechoic chambers, acoustics, EMC and RF shielding solutions
Volume 20 -
Issue 8 -
08/22/2025
How advanced data acquisition is powering breakthroughs in university STEM research; How to perform safe, fast double pulse tests of SiC devices with only an oscilloscope; Oscilloscopes for high channel and power electronics applications
Volume 20 -
Issue 7 -
07/25/2025
How to use an Antenna Factor (AF); Enhancing efficiency: Strain gauge based smart sensors with IO-Link interface; New 8 GHz SDS7000 series oscilloscopes expands into new applications; The leader in test equipment components: DC-110 GHz
Volume 20 -
Issue 6 -
06/27/2025
Design of a single pair Ethernet system with power over data lines (SPoE); Enhancing efficiency: Strain gauge based smart sensors with IO-Link interface; Oscilloscopes for high channel and power electronics applications
Volume 20 -
Issue 5 -
05/23/2025
New DC + AC SMU for nanodevice testing; The engineer's guide to electronic defects; Real-time portable signal analysis; Built for industry — Engineered for innovation
Volume 20 -
Issue 4 -
04/25/2025
Custom vs standard: Which option is right for your transformer?; Ultimate modular LXI system for precision and scalability in data acquisition and electronic test applications; Performance vector RF signal generation; Empowering defense and commercial advanced testing; Measuring temperature of the smallest, complex structures of components?
Volume 20 -
Issue 3 -
03/28/2025
Inductive SMT components in comparison — The wire makes the difference; High-performance linear DC power supplies; Performance vector RF signal generation; Infrared lock-in thermography
Volume 20 -
Issue 2 -
02/28/2025
Transient voltage suppressor diodes (TVS) information; The ultimate test and measurement upgrade; Precision unleashed: digital storage oscilloscope; New 1500 W high power programmable DC power supplies; Measuring temperature of the smallest, complex structures of components?
Volume 20 -
Issue 1 -
01/24/2025
Useful formulas for RF related conversions; Revolutionizing submarine cable testing with unmatched precision and efficiency; High resolution oscilloscopes address signal fidelity challenges; Monopulse comparators: Ultra-broadband beamforming test solutions
Volume 19 -
Issue 12 -
12/27/2024
Curve tracers information; Battery monitors and testers; Maximize the memory depth of your HD3 oscilloscope
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