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Technical Articles
A Collection of OIM™Applications (.pdf)
(Microscopy)
Orientation Imaging Microscopy OIM is a technique for characterizing the crystallographic orientation aspects of material microstructures. The technique is based on automated indexing of electron...
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A Paramertic Study of Electron Backscatter Diffraction based Grain Size Measurements (.pdf)
(Product and Material Testing)
Polycrystalline microstructures can be well imaged using maps reconstructed from orientation data collected by electron backscatter diffraction (EBSD) in the scanning electron microscope (SEM). These...
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