Product Announcements:
Inspection Tools and Instruments

Applications

• Nanopositioner calibration
• Transducer calibration
• Alignment
• Position creep measurements

Advantages

• Direct optical access
• Piezo nanopositioner ready
• High stability microscope with precision alignment
• Fixed or automated objective lens positioning
• Flexible design with multiple configurations

Scanning electron microscope has the advantages of large depth of field and high resolution, and has been widely used in the field of fracture analysis. By observing and studying the morphology of the fracture, we can analyze the cause, nature, mode, mechanism, etc., and also understand the details of the stress condition and crack expansion rate at the time of fracture. Read more...

Unlocking the Power of SEM: Dive into Copper Foil Morphology Read more...

CIQTEK SEM4000Pro is an analytical field emission scanning electron microscope equipped with a high-brightness long-life Schottky field emission electron gun. Read more...

The scanning electron microscope, as a conventional microscopic characterization equipment, has the advantages of large magnification, high resolution, large depth of field, clear imaging, and strong stereoscopic sense, which is the preferred equipment for characterizing the structure of nano-alumina. Click More Info Read more...

CIQTEK DB500 is a Field Emission Scanning Electron Microscope with a Focused Ion Beam column for nano analysis and specimen preparation. Read more...

Unprecedented 0.6 nm Resolution, Versatile Application Reach. Read more...

CIQTEK SEM5000X is an ultra-high resolution Field Emission Scanning Electron Microscope (FE-SEM) with breakthrough resolution of 0.6 nm@15 kV and 1.0 nm@1 kV. Read more...

Chromatic Confocal Sensor can measure thickness, height and displacement of transparent and highly-reflective materials at micron level. It’s especially suitable for measuring glass, display, PCB and film. The whole sensor system consists of a sensor controller and one or more sensor heads. Read more...