Field Emission Scanning Electron Microscope

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Scanning Electron Microscope Applications

The scanning electron microscope, as a conventional microscopic characterization equipment, has the advantages of large magnification, high resolution, large depth of field, clear imaging, and strong stereoscopic sense, which is the preferred equipment for characterizing the structure of nano-alumina. 

The preparation methods of nano-alumina can be divided into three main categories: solid phase, gas phase and liquid phase. In order to verify that the results of the prepared alumina nanopowder are as expected, the structure of alumina under each process is characterized, of which microscopic observation is the most intuitive method.

The article showing the alumina powder prepared under different processes observed using CIQTEK Field Emission Scanning Electron Microscope SEM5000, which contains alumina nanopowders in the form of cubes, flakes, and rods, and with particle sizes of tens to hundreds of nanometers.

SEM5000 Features

CIQTEK SEM5000 is a field emission scanning electron microscope with high-resolution imaging and analysis ability, supported by abundant functions, benefits from advanced electron optics column design, with high-pressure electron beam tunnel technology (SuperTunnel), low aberration, and non-immersion objective lens, achieves low voltage high-resolution imaging, the magnetic specimen can also be analyzed.

With optical navigation, automated functionalities, carefully designed human-computer interaction user interface, and optimized operation and use process, offering a quickly and complete high-resolution imaging and analysis work.

  • Resolution: 0.9nm @ 15kV, SE; 1.3nm @ 1kV, SE; 0.8nm @ 30kV, STEM
  • Magnification: 1-2,500,000 x
  • Acceleration Voltage: 20V-30 kV