Benchtop Surface Metrology Equipment

14 Results
Micro Lens Process Metrology System -- Compass™ RT
from Zygo Corporation

ZYGO's Compass ™ metrology systems set the benchmark for automated, non-contact 3D surface metrology and process control for discrete micro lenses and molds critical to compact imaging systems such as automotive vision systems and cameras for smart phones and tablets. There are two models of... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Form; Surface Profilometry; Area or three dimensional profile
Sub-Micron Structured Light 3D Scanner -- MIKROCAD LITE
from LMI Technologies

MikroCAD delivers sub-micron accuracy and repeatability on a variety of challenging scan surfaces such as shiny, reflective and steep edges, in contrast to confocal solutions that are unable to handle steeply angled geometries. With MikroCAD 3D Surface Metrology you can: Measure roughness and... [See More]

  • Mounting / Loading Options: Benchtop
  • Technology: Optical / Laser
  • Measurement Capability: Form; Surface Profilometry; Area or three dimensional profile
  • Display & Special Features: PC Interface / Networkable
3D White Light Interferometer Optical Measuring Unit - MarSurf -- WM 100
from Mahr Inc.

The precision optical measuring instrument MarSurf WM 100 with sub-nanometer resolution and measuring accuracy. A 3D white light interferometer measuring system. Features. Maximum precision with sub-nanometer resolution and measuring accuracy. Suitable for all optical and reflective surfaces, fine... [See More]

  • Mounting / Loading Options: Benchtop
  • Technology: Optical / Laser
  • Measurement Capability: Surface Profilometry; 2D / Line Profile; Area or three dimensional profile
  • Applications: Bearings, Gears, Shafting, Seals, etc.; Optics / Photonics; Electronics; Medical
Contour Measuring System -- Contourecord 1700/2700
from Carl Zeiss Industrial Metrology, LLC

Flexible CNC measuring station for simple contour measurements. All CONTOURECORD machines use the same base column. The only difference is the sensors. With the purchase of additional sensors, you can turn your surface measuring instruments into a contour measuring system – or vice versa. [See More]

  • Mounting / Loading Options: Benchtop
  • Standards Compliance: ASME; ISO / EN; DIN; JIS; CNOMO
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Waviness; Roughness
  • Technology: Contact / Stylus
Optical Surface Profilometry -- TMS-100
from Polytec, Inc.

Polytec's TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system designed to characterize flat and curved surfaces. Incorporating a scanning white light interferometer, the Metro.Lab can measure flatness and general topography with 20 nanometer resolution and... [See More]

  • Mounting / Loading Options: Benchtop
  • Technology: Optical / Laser
  • Measurement Capability: Area or three dimensional profile; Flatness; Parallelism; Roundness
  • Applications: R&D, Chemical, Textile, Paper Industry; Aerospace / Defense; Automotive
Combined Contour and Surface Desktop Measuring Station - MarSurf -- LD 130 / LD 260
from Mahr Inc.

MarSurf LD 130 / LD 260. A step into a new dimension. Combined contour and roughness measurements in just one step come courtesy of proven cutting-edge technology from Mahr metrology. The MarSurf LD 130 and MarSurf LD 260 measuring stations have been systematically developed to draw on the... [See More]

  • Mounting / Loading Options: Benchtop
  • Applications: Automotive; Bearings, Gears, Shafting, Seals, etc.; Optics / Photonics; Medical
  • Measurement Capability: Form; Roughness
  • Display & Special Features: PC Interface / Networkable
Mobile Surface Measuring Instrument -- Surfcom 130
from Carl Zeiss Industrial Metrology, LLC

SURFCOM 130 is designed for mobile use in production. The separate control and analysis unit features a touchscreen display and a printer. An interface enables external data storage and professional analysis with ACCTee PRO on a computer. Compact tracing driver. Highly accurate free stylus-and-arm... [See More]

  • Mounting / Loading Options: Handheld or Portable; Benchtop
  • Standards Compliance: ASME; ISO / EN; DIN; JIS; CNOMO
  • Measurement Capability: 2D / Line Profile; Area or three dimensional profile; Waviness; Roughness
  • Technology: Contact / Stylus
Optical Surface Profilometry -- TMS-1200
from Polytec, Inc.

The TopMap µ.Lab is a complete white-light interferometric measurement microscope workstation for micro-topography measurement on almost any surface. The system is well suited to product development and off-line quality control measurements. [See More]

  • Mounting / Loading Options: Benchtop
  • Technology: Optical / Laser
  • Measurement Capability: Area or three dimensional profile; Flatness; Parallelism; Roundness
  • Applications: R&D, Chemical, Textile, Paper Industry; Aerospace / Defense; Automotive
Combined Contour and Surface Desktop Measuring Station - MarSurf -- UD 130
from Mahr Inc.

The first step into high-precision roughness and contour metrology. Features. With the MarSurf UD130 Mahr has created the successor to the successful MarSurf UD120 and closed the gap between the high-end solution MarSurf LD130/LD260 and the standard combination measuring station MarSurf XCR20 with... [See More]

  • Mounting / Loading Options: Benchtop
  • Display & Special Features: PC Interface / Networkable
  • Measurement Capability: Form; Roughness
Optical Surface Profilometry -- TMS-300
from Polytec, Inc.

Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available... [See More]

  • Mounting / Loading Options: Benchtop
  • Technology: Optical / Laser
  • Measurement Capability: Area or three dimensional profile; Flatness; Parallelism; Roundness
  • Applications: R&D, Chemical, Textile, Paper Industry; Aerospace / Defense; Automotive
Compact Form Measuring Machine - MarForm -- MMQ 150
from Mahr Inc.

Product features. MarForm MMQ 150 - The entry into the world of cylindricity metrology The MMQ 150 is an automatic measuring machine for the testing of form and location tolerances: Use in production or measuring room. Fast and easy operation. Measuring accuracy, optimized for cylindricity... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Form; Straightness; Roundness; Runout
Compact Form Measuring Machine - MarForm -- MMQ 200
from Mahr Inc.

Product features. The MMQ 200 is the compact form measuring machine for manufacturing workshops and inspection rooms. Features. Proof of form and position deviations as per DIN/ISO 1101. Fully automatic measuring sequences. Precision roundness measuring axis (C). Motorized vertical measuring axis... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Form; Straightness; Roundness; Runout
Computer-controlled Optical Measuring Unit - MarSurf -- CWM 100
from Mahr Inc.

Product features. The precision, computer-controlled optical measuring instrument MarSurf CWM 100 with sub-nanometer resolution. A combined 3D measuring system comprising a confocal microscope and white light interferometer. Features Advantages. Special microscope technology dedicated to the... [See More]

  • Mounting / Loading Options: Benchtop
  • Technology: Optical / Laser
  • Measurement Capability: Surface Profilometry; Area or three dimensional profile
  • Applications: Bearings, Gears, Shafting, Seals, etc.; Optics / Photonics; Electronics; Medical
Form Tester - MarForm -- MMQ 100
from Mahr Inc.

Product features. The MarForm MMQ 100 form tester is the ideal solution for simple yet powerful measuring tasks. Features. Fast and accurate measuring results. Mechanical bearings for reliability. Large measuring volume. Low weight and compact size for greater mobility. Fast, computer-aided... [See More]

  • Mounting / Loading Options: Benchtop
  • Measurement Capability: Form; Roundness; Runout