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Supplier: Bruker Corporation
Description: Elemental Analysis, Process and Quality Control X-ray fluorescence analysis (XRF) one of the best analytical techniques to perform elemental analysis in all kinds of samples, no matter if liquids, solids or loose powders must be analyzed. XRF combines highest accuracy and precision
- Remote Interface: Application Software Included, Computer Interface
- Special Features: Chemical Mapping or Imaging
- General Features: Portable
- Excitation Source: X-Ray Tubes
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Supplier: Metrohm USA, Inc.
Description: The 2060 XRF Process Analyzer is a non-destructive, online analyzer that uses energy-dispersive X-ray fluorescence (EDXRF) technology for near real-time monitoring of liquid sample streams in industrial processes. The analyzer enables continuous, automated XRF analysis
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Supplier: Evident Scientific
Description: The MESA-7220 is based on the latest advances in Energy Dispersive X-ray Fluorescence (EDXRF) technology. It features diffractive optics for ultra high performance for low atomic elements - specifically S and Cl - in oils and other fluids. This approach is critical for a user to
- Detection Limit: 0.5 ppm
- Operating Temperature: -13 to 104 F
- Operating Humidity: 0 to 95 %
- Remote Interface: Application Software Included, Computer Interface, Serial Interface
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Supplier: Hitachi High-Tech America
Description: uninterrupted metals analysis, all-day long, in the harshest environments. The X-MET8000 XRF Analyzer, is ideal for scrap metal analysis, precious metals and jewelry analysis, and positive material identification (PMI) for inspection and manufacturing applications. X-MET8000 Series XRF
- Detector Window: Be Window
- General Features: Data Processing Functions, Portable
- User Interface: Digital Front Panel
- Display: Digital Readout
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Supplier: Hitachi High-Tech America
Description: The FT230 benchtop XRF analyzer has been designed to significantly reduce the time taken to make a measurement. Recognizing that the most time is taken with sample setup and measurement recipe selection, engineers at Hitachi have created a ground-breaking analyzer that effectively ‘sets up’
- Operating Temperature: 50 to 104 F
- Operating Humidity: 90 %
- Remote Interface: Computer Interface
- General Features: Data Processing Functions, Data Storage / Data Logger, Programmable
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Supplier: Bruker Corporation
Description: Handheld laser induced breakdown spectrometry (HH-LIBS) is an emerging method which shows promising capabilities for alloy analysis and may be able to complement HH-XRF in alloy analysis; especially in alloys containing low atomic number elements like Be, Li, Mg, Al and Si. Contact our sales
- Excitation Source: Laser-Induced Breakdown
- General Features: Portable
- Detector: Solid State (CCD)
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Supplier: Rigaku Corporation
Description: channels enable simultaneous measurement of multiple elements of interest for high throughput. The high energy resolution of this wavelength-dispersive XRF system, compared to energy-dispersive XRF systems, is especially useful to minimize peak overlap when
- Maximum Wafer / Part Size: 200 mm
- Measurements: Composition, Thickness - Film / Layer
- Mounting / Loading: Floor Mounted / Stand-alone
- Form Factor: Monitor / Instrument
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Description: ISO 13196:2013 specifies the procedure for screening soils and soil-like materials for selected elements when handheld or portable energy-dispersive XRF spectrometers are used. This quick method is assumed to be applied on-site to obtain qualitative or semiquantitative
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Supplier: CSA Group
Description: ISO 13196:2013 specifies the procedure for screening soils and soil-like materials for selected elements when handheld or portable energy-dispersive XRF spectrometers are used. This quick method is assumed to be applied on-site to obtain qualitative or semiquantitative
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Supplier: ASTM International
Description: 1.1 This test method covers field portable X-ray fluorescence (XRF) spectrometric procedures for analyses of arsenic and lead in glass compositions using field portable energy dispersive XRF spectrometers. 1.2 The mass fraction range of arsenic within which this
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Supplier: ASTM International
Description: health practices and determine the applicability of regulatory requirements prior to use. 8.1 A test method example is provided for the analysis of nickel and vanadium in equilibrium FCC catalyst using either a wavelength or an energy-dispersive X-ray spectrometer and test
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Supplier: ASTM International
Description: 1.1 This test method covers field portable X-ray fluorescence (XRF) spectrometric procedures for analyses of arsenic and lead in glass compositions using field portable energy dispersive XRF spectrometers. 1.2 The mass fraction range of arsenic within which this
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Supplier: Xenemetrix Ltd.
Description: X-PMA Precious Metals EDXRF Spectrometer fast, accurate, easy to use XRF is a non-destructive analytical technique that can rapidly and easily identify and determine the presence of various elements such as gold, platinum, silver and other precious metals present in solid, powdered and
- Remote Interface: Application Software Included, Computer Interface
- Detector Window: Be Window
- Special Features: Cooled Detector
- User Interface: Digital Front Panel
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Supplier: ASTM International
Description: employing an X-ray tube for excitation in conjunction with wavelength dispersive detection system or energy dispersive high resolution semiconductor detector with the ability to separate signals of adjacent and near-adjacent elements. 1.4 This test method uses inter-element
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The 2060 XRF Process Analyzer is a non-destructive online process analyzer employing Energy-Dispersive X-ray Fluorescence (EDXRF) technology. This analyzer ensures precise and nearly real-time monitoring of liquid sample streams within (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Metrohm USA, Inc. -
XRF Instruments - MasterXRF The Standard of Accuracy The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Pratt & Whitney Measurement Systems, Inc. -
XRF Instruments - MasterXRF The Standard of Accuracy The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Pratt & Whitney Measurement Systems, Inc. -
X-ray fluorescence, or XRF, is a nondestructive technique used to analyze the elemental composition of a material. The process begins when a sample is exposed to X-rays, which excites the atoms within it. This excitation causes the atoms to release energy in the form of characteristic X (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Metrohm USA, Inc. -
XRF Instruments - MasterXRF The Standard of Accuracy The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Pratt & Whitney Measurement Systems, Inc.
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Atomic and Nuclear Analytical Methods
Figure 1.11 shows a schematic view of an energy dispersive XRF spectrometer .
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Nuclear and atomic physics in art research and diagnostic
For example an energy dispersive XRF spectro- meter (see sect. 2), has an information capacity of 80 bits for qualitative analysis and of about 940 bits for the quantitative one at 0.2~/o relative error and for element concentrations between about 0…
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Federal Register > Wednesday, February 9, 2005 > [70 FR 6930] National Emission Standards for Hazardous Air Pollutants for Petroleum Refineries: Catalytic Crac...
In energy dispersive XRF spectrometers , all secondary x-rays (of all wavelengths) enter the detector at once.
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Focus-1 x-ray fluorescent spectrometer
An energy dispersive XRF spectrometer equipped with a capillary lens having a spot size of 200 tm has been developed in the Institute for Roentgen Optics.
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In situ analysis of stratified glass eye beads from the tomb of Marquis Yi of the Zeng State in Hubei Province, China using XRF and micro‐Raman spectrometry
The chemical compositions, including some trace elements, of the 46 stratified glass eye beads were quantitatively determined using an OUTSTEX 100FA type portable energy dispersive XRF spectrometer .
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Crocoite PbCrO 4 and mimetite Pb 5 (AsO 4 ) 3 Cl: rare minerals in highly degraded mediaeval murals in Northern Bohemia
Non-invasive X-ray fluorescence (portable XRF) In the first stage of materials investigation of the Kuřívody wall paintings, non-invasive XRF measurements were carried out in situ using two hand-held energy dispersive XRF spectrometers : the X- MET 3000 TXR by…
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Structural characterization of oil shale occurring in Mengen, Turkey
A PANalytical MiniPal4 Energy Dispersive XRF spectrometer was employed to perform ash analysis of the sample and the results are given in Table 2.
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Characterization of some tin‐contained ancient glass beads found in China by means of SEM–EDS and raman spectroscopy
Characterization of some an- cient glass vessels fragments found in Xinjiang, China, using a portable energy dispersive XRF spectrometer .
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Modified Silico-Tungstate: An Easy and Efficient Catalyst for the Acetylation of Amines Under Solvent-Free Condition
Metal loading in catalysts was determined by XRF using energy dispersive XRF spectrometer (Fischerscope X-Ray XAN- FAD BC).