-
Supplier: ValueTronics International, Inc.
Description: The 4192A is an impedance analyzer from HP Agilent. Electrical impedance analyzers enable the measurement and monitoring of the opposition to current in AC, or alternating current, systems. Impedance refers to how the chemical or physical properties interact with
-
Supplier: ValueTronics International, Inc.
Description: The 8556A is a used analyzer from HP. Analyzers are key tools to test electronic equipment in the engineering, medical, automotive, and technological industries. Use analyzers for monitoring the performances of many different types of electronic devices. You may need
-
Supplier: ValueTronics International, Inc.
Description: Function and RF Impedance Test Kit A full-featured impedance measurement function (useful for quick-check general-purpose impedance applications) can be added to the Agilent 4396A by adding Option 010 and the HP 43961A RF impedance test kit. Covering from 100 kHz to 1.8
- Frequency Range: 1,800,000 kHz
-
-
Supplier: ValueTronics International, Inc.
Description: The 3551A is a communication analyzer from Agilent. A communication analyzer is a superior type of electronic test equipment for physical layer, circuit, and new technology testing. Anyone in the business of testing data networks can use a communication analyzer for the
-
Supplier: QuinStar Technology, Inc.
Description: detection, monitoring, built-in-test and frequency measurement. The detectors can also be used in millimeter-wave test systems with a wide variety of high-impedance oscilloscopes and scalar analyzers. They can be used for both CW and pulsed power measurements. They are constructed with
- Input Frequency Range: 18,000 to 170,000 MHz
- Power Level: 16.989700043360187 to 20 dBm
- Package Type: Connectorized
- Connectors: SMA
-
Supplier: Columbia Research Labs, Inc.
Description: level low impedance output and require no additional signal conditioning. Consult the factory for customized versions of these sensors. Features High Sensitivity High Performance Fluid Rotor Design
- Acceleration: 0.1 to 300 g
- Frequency Range: 1 to 1,000 Hz
- Minimum Accuracy: -4 to 4 +/-% FS
- Linear Velocity: 0.1 to 300 in/sec
Find Suppliers by Category Top
More Information Top
Indicates content that may require registration and/or purchase.
-
Interface trap states in Al 2 O 3 /AlGaN/GaN structure induced by inductively coupled plasma etching of AlGaN surfaces
3 Results and discussion We initially performed a conventional C–V measurement using an HP4192 imped- ance analyzer at a measurement frequency of 10 kHz at room temperature (RT) to characterize the Al2O3/AlGaN interface properties.
-
Nanotechnology and Advanced Materials
The C-V, dissipation factor and the I-V curves of the MIM capacitors were measured by using a HP4192 Impedance Analyzer and a HP4155 Parameter Analyzer, respectively.
-
Dielectric Relaxation of La-Doped Zirconia Caused by Annealing Ambient
C–V and C–f measurements were carried out using a HP4192 impedance analyzer and an Agilent E4980A LCR meter at various frequencies (20 Hz–13 MHz) in parallel mode.
-
Optical and Dielectric Properties and Microstructures of rf-Magnetron Sputtered ZnO-Doped Zr0.8 Sn0.2 TiO4 Films on Indium Tin Oxide/Glass Substrates
The C–V and I–V curves of the MIM capacitors were measured using a HP4192 impedance analyzer and a HP4156 parameter analyzer, respectively.
-
Effect of conducting polymer poly (3,4-ethylenedioxythiophene) (PEDOT) nanotubes on electro-optical and dielectric properties of a ferroelectric liquid crystal
Dielectric data were recorded in the frequency range from 10 Hz to 13 MHz us- ing a HP4192 Impedance Analyzer .
-
Structural and electrical properties of sol–gel derived Ge nanocrystals in SiO2 films
An Agi- lent HP4192 impedance analyzer was used for these mea- surements.
-
Oriented growth of piezoelectric crystallites at the normal direction of glass cylinders
An HP4192 impedance analyzer was applied to measure the dielectric and piezoelectric properties.
-
Fabrication and characteristics of PZT thick films on Pt/Ti foil substrates for piezoelectric vibrators
The dielectric property of the film was measured by a HP4192 impedance analyzer .
-
Deposition of Lanthanum Zirconium Oxide High‐ k Films by Liquid Injection ALD and MOCVD
High-fre- quency (HF) C–V measurements were conducted using a HP4192 imped- ance analyzer with a 30 mV rms probe signal.
-
Growth of HfO 2 by Liquid Injection MOCVD and ALD Using New Hafnium‐Cyclopentadienyl Precursors
High- frequency (HF) C–V measurements were conducted using a HP4192 imped- ance analyzer with a 30 mV RMS probe signal.