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Supplier: ValueTronics International, Inc.
Description: The 4192A is an impedance analyzer from HP Agilent. Electrical impedance analyzers enable the measurement and monitoring of the opposition to current in AC, or alternating current, systems. Impedance refers to how the chemical or physical properties
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Supplier: ValueTronics International, Inc.
Description: 110 MHz, 3 m ohm 500M ohm Powerful impedance analysis function Ease of use and versatile PC connectivity The Keysight Agilent HP 4294A precision impedance analyzer is an integrated solution for efficient impedance measurement and analysis of components and circuits
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Supplier: ValueTronics International, Inc.
Description: The 4191A is an impedance analyzer from HP Agilent. Electrical impedance analyzers enable the measurement and monitoring of the opposition to current in AC, or alternating current, systems. Impedance refers to how the chemical or physical properties interact
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Supplier: ValueTronics International, Inc.
Description: The 4194A is an impedance analyzer from HP Agilent. Electrical impedance analyzers enable the measurement and monitoring of the opposition to current in AC, or alternating current, systems. Impedance refers to how the chemical or physical properties interact
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Supplier: Columbia Research Labs, Inc.
Description: The Columbia Models SR-107RFR and SR-207RFR are precision force balance angular accelerometers. This design makes use of the fluid rotor concept of sensing angular acceleration and in conjunction with the Columbia patented HP suspension system provides the ultimate in reliability and
- Acceleration: 0.1000 to 300 g
- Features: Battery Powered, Other
- Frequency Range: 1 to 1000 Hz
- Linear Velocity: 0.1000 to 300 in/sec
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Supplier: QuinStar Technology, Inc.
Description: useful for power detection, monitoring, built-in-test and frequency measurement. The detectors can also be used in millimeter-wave test systems with a wide variety of high-impedance oscilloscopes and scalar analyzers. They can be used for both CW and pulsed power measurements. They are
- Input Frequency Range: 18000 to 170000 MHz
- Package Type: Connectorized
- Power Level: 16.99 to 20 dBm
- RF Connector: SMA
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Interface trap states in Al 2 O 3 /AlGaN/GaN structure induced by inductively coupled plasma etching of AlGaN surfaces
3 Results and discussion We initially performed a conventional C–V measurement using an HP4192 imped- ance analyzer at a measurement frequency of 10 kHz at room temperature (RT) to characterize the Al2O3/AlGaN interface properties.
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Nanotechnology and Advanced Materials
The C-V, dissipation factor and the I-V curves of the MIM capacitors were measured by using a HP4192 Impedance Analyzer and a HP4155 Parameter Analyzer, respectively.
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Dielectric Relaxation of La-Doped Zirconia Caused by Annealing Ambient
C–V and C–f measurements were carried out using a HP4192 impedance analyzer and an Agilent E4980A LCR meter at various frequencies (20 Hz–13 MHz) in parallel mode.
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Optical and Dielectric Properties and Microstructures of rf-Magnetron Sputtered ZnO-Doped Zr0.8 Sn0.2 TiO4 Films on Indium Tin Oxide/Glass Substrates
The C–V and I–V curves of the MIM capacitors were measured using a HP4192 impedance analyzer and a HP4156 parameter analyzer, respectively.
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Effect of conducting polymer poly (3,4-ethylenedioxythiophene) (PEDOT) nanotubes on electro-optical and dielectric properties of a ferroelectric liquid crystal
Dielectric data were recorded in the frequency range from 10 Hz to 13 MHz us- ing a HP4192 Impedance Analyzer .
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Structural and electrical properties of sol–gel derived Ge nanocrystals in SiO2 films
An Agi- lent HP4192 impedance analyzer was used for these mea- surements.
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Oriented growth of piezoelectric crystallites at the normal direction of glass cylinders
An HP4192 impedance analyzer was applied to measure the dielectric and piezoelectric properties.
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Fabrication and characteristics of PZT thick films on Pt/Ti foil substrates for piezoelectric vibrators
The dielectric property of the film was measured by a HP4192 impedance analyzer .
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Deposition of Lanthanum Zirconium Oxide High‐ k Films by Liquid Injection ALD and MOCVD
High-fre- quency (HF) C–V measurements were conducted using a HP4192 imped- ance analyzer with a 30 mV rms probe signal.
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Growth of HfO 2 by Liquid Injection MOCVD and ALD Using New Hafnium‐Cyclopentadienyl Precursors
High- frequency (HF) C–V measurements were conducted using a HP4192 imped- ance analyzer with a 30 mV RMS probe signal.