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Supplier: Rigaku Corporation
Description: Winner of the 2007 R&D 100 award, a mark of excellence known to industry, government, and academia as proof that the winner is one of the most innovative products of the year, the Rigaku NANOHUNTER benchtop total reflection X-ray fluorescence (TXRF) spectrometer was specifically designed to
- Computer Interface: Yes
- Detector Type: Other
- Excitation Source: X-Ray Tubes
- Module Type: Wavelength Dispersive
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Supplier: Rigaku Corporation
Description: Introduced by Rigaku Innovative Technologies in the early 1990’s, graded multilayer monochromators provide increased intensity and decreased background for Total Reflection X-ray Fluorescence Spectrometry. Max-Flux® Optics use graded multilayers, assuring the same X-ray energy
- Vacuum: Yes
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Supplier: Shimadzu Scientific Instruments, Inc.
Description: XRD-6000 – General-purpose X-Ray Diffractometer The Windows XP-supported application software ushers this compact, multi-functional, general-purpose X-ray Diffractometer into the networking era of analysis. With its basic ease of use and abundant functions, the XRD-6000
- Angular Range: -6 to 163 degrees
- Detector Type: Scintillation
- Diffracted Beam Optics: Monochromating Crystal
- Sample/Detector Positioning System: Goniometer
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Supplier: Rigaku Corporation
Description: , assuring the same X-ray energy diffracts from every point along the surface of the Parabolic optic. Rigaku’s Osmic® Coating technology provides results in less than 0.5% d-spacing variation. Such high precision means more flux is available for your experiment. Optical precision
- Vacuum: Yes
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Supplier: Evident Scientific
Description: The MESA-7220 is based on the latest advances in Energy Dispersive X-ray Fluorescence (EDXRF) technology. It features diffractive optics for ultra high performance for low atomic elements - specifically S and Cl - in oils and other fluids. This approach is critical for a user to achieve the
- Application Software Included: Yes
- Computer Interface: Yes
- Computer Interface Options: Serial Interface
- Cooled Detector: Yes
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Supplier: Rigaku Corporation
Description: 2012 heralds the newest additions to the MiniFlex series of benchtop X-ray diffraction (XRD) analyzers. The new 5th generation MiniFlex is a general purpose X-ray diffractometer that can perform qualitative and quantitative analysis of polycrystalline materials. MiniFlex is now
- Angular Range: -3 to 145 degrees
- Detector Type: Scintillation
- Diffracted Beam Optics: Monochromating Crystal, Collimators and Slits, K-Beta Absorption Filter
- Diffraction Method: Powder
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Supplier: Applied Diamond, Inc.
Description: greater strength. Applied Diamond Inc. produces optical grade diamond films in a variety of thickness and cut to various geometries. Diamond's exceptional properties provide benefits in a variety applications: High Energy Research X-ray Multi
- Laser / Heat Resistant: Yes
- Materials: Other
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Supplier: HG Optronics, Inc.
Description: : HGO grows LiF crystal lithium fluoride. LiF crystal or lithium fluoride crystal is an optical material with outstanding transmittance in VUV region. It is widely used for windows, prisms, and lenses in the visible and infrared in 0.104µm-7µm. Main application: 1) X-ray
- Material: Other / Specialty Material
- Optical Application: Infrared, Visible, Ultraviolet
- Refractive Index: 1.37 to 1.62 n
- Surface Flatness: λ/8, Other
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Supplier: Newport MKS
Description: The 33067FL01-010R Plane Ruled Reflection Grating is 25 x 50 mm and 6 mm thick. The grating has 600 grooves per mm a nominal wavelength at 300 nm, and a nominal blaze angle of 5.2°. The diffraction grating is coated with an aluminum coating on float glass substrate and designed for first
- Blaze Wavelength: 300 nm
- Grating Design: Plane Reflection
- Grating Type: Ruled Grating
- Groove Frequency: 600 grooves per mm
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Supplier: Newport MKS
Description: The 33010FL01-280R Plane Ruled Reflection Grating is 50 x 50 mm and 6 mm thick. The grating has 1200 grooves per mm a nominal wavelength at 500 nm, and a nominal blaze angle of 17.5°. The diffraction grating is coated with an aluminum coating on float glass substrate and designed for first
- Blaze Wavelength: 500 nm
- Grating Design: Plane Reflection
- Grating Type: Ruled Grating
- Groove Frequency: 1200 grooves per mm
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Supplier: Newport MKS
Description: The 33067FL01-050R Plane Ruled Reflection Grating is 25 x 50 mm and 6 mm thick. The grating has 600 grooves per mm a nominal wavelength at 250 nm, and a nominal blaze angle of 4.3°. The diffraction grating is coated with an aluminum coating on float glass substrate and designed for first
- Blaze Wavelength: 250 nm
- Grating Design: Plane Reflection
- Grating Type: Ruled Grating
- Groove Frequency: 600 grooves per mm
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Supplier: Newport MKS
Description: The 33067FL01-330R Plane Ruled Reflection Grating is 25 x 50 mm and 6 mm thick. The grating has 1200 grooves per mm a nominal wavelength at 400 nm, and a nominal blaze angle of 14°. The diffraction grating is coated with an aluminum coating on float glass substrate and designed for first
- Blaze Wavelength: 400 nm
- Grating Design: Plane Reflection
- Grating Type: Ruled Grating
- Groove Frequency: 1200 grooves per mm
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Applications of LiF windows 1. X-Ray monochromator 2. Vacuum ultraviolet 3. X-ray diffraction devices 4. Deep UV technology (read more)
Browse Infrared Windows Datasheets for Changchun Yutai Optics Co., Ltd. -
By adopting the newly-designed user interface that allows for operation in Japanese environment, ”Easy, Immediate operation just for Anyone” has been realized. In addition, equipping a Kaufman-type etching ion source and a twin anode as standard, the JPS-9030 has a wide range of expandability such as a high temperature heating system and a gas cluster ion source.
(read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for JEOL USA, Inc. -
This white paper reports diesel engine oil analysis data demonstrating use of filtergram particle quantifier x-ray fluorescence (FPQ spectroscopy) to quantify severity of wear and (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for AMETEK Spectro Scientific -
XRF Instruments - MasterXRF The Standard of Accuracy The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Pratt & Whitney Measurement Systems, Inc. -
The 2060 XRF Process Analyzer is a non-destructive online process analyzer employing Energy-Dispersive X-ray Fluorescence (EDXRF) technology. This analyzer ensures precise and nearly real-time monitoring of liquid sample streams within (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Metrohm USA, Inc. -
XRF Instruments - MasterXRF The Standard of Accuracy The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry. It is the ideal (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Pratt & Whitney Measurement Systems, Inc. -
X-ray fluorescence, or XRF, is a nondestructive technique used to analyze the elemental composition of a material. The process begins when a sample is exposed to X-rays, which excites the atoms within it. This excitation causes the atoms to release energy in the form of characteristic X-rays (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Metrohm USA, Inc. -
XRF Instruments - MasterXRF The Standard of Accuracy The MasterXRF® instruments are X-ray fluorescence spectrometers for the inline analysis of plating solutions in the electroplating industry (read more)
Browse X-Ray Fluorescence Spectrometers Datasheets for Pratt & Whitney Measurement Systems, Inc.
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Piezo-Mechanisms in X-Ray Spectroscopy: Energy Selection in a Beam Line
PiezoWalk principle shows advantages for Monochromator crystal fine adjustment.
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Test trainer experimental physics
With a help of a roentgen monochromator , a certain wave length (energy) is sifted while the angle of incidence of the crystal is rotated (see Abb. 7.12 and discussion in the theory part).
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Physics
Appear quite wide to Abb. 8.4, lies on the low resolving power of the used roentgen monochromator .
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Röntgen Fabry Pérot‐Interferometer
There is no roentgen monochromator that can dissolve so sharp resonances.
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Physics
That the lines in * appear quite wide to Abb. 8.4, lies on the low resolving power of the used roentgen monochromator .
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Physics
That dieLinienin fits 8.4 rechtbreiterscheinen Abb. on the low resolving power of the used roentgen monochromator .
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Physics
Appear quite wide to Abb. 8.4, lies on the low resolving power of the used roentgen monochromator .
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X-ray backscattering (diffraction at a Bragg angle of π/2): A review
However, the study of vibrational modes in con densed media or vibrations in magnetic crystals calls for X ray monochromators providing (ΔE)c/Е ≤ 10–7.
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Dispersion characteristics of film X-ray monochromators made of pyrolytic graphite
X ray monochromators made of pyrolytic graphite (PG) are used in X ray spectrum and diffraction anal yses.
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Magnetic circular dichroism in the hard X-ray range
Therefore, it is useful to consider the polarization transfer function of a double crystal X ray monochromator .
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Kosmos station: Application of synchrotron radiation from the VEPP-4M storage ring for metrological measurements in the VUV and soft X-ray ranges
X RAY MONOCHROMATOR (80–2000 eV) .