-
Supplier: Shimadzu Scientific Instruments, Inc.
Description: XRD-6000 – General-purpose X-Ray Diffractometer The Windows XP-supported application software ushers this compact, multi-functional, general-purpose X-ray Diffractometer into the networking era of analysis. With its basic ease of use and abundant functions, the XRD-6000
- Angular Range: -6 to 163 degrees
- Detector Type: Scintillation
- Diffracted Beam Optics: Monochromating Crystal
- Sample/Detector Positioning System: Goniometer
-
Supplier: Bruker Corporation
Description: Non-destructive Characterization of Material Properties Bruker's X-ray Diffraction and Scattering portfolio enables detailed analysis of any material from fundamental research to industrial quality control providing forward looking solutions to our customers today. Applications of these
- Diffraction Method: Powder, Laue - Single Crystal, Other Method
- Features: Benchtop, High Resolution / Crystal Quality
- Wave Type: X-Ray
-
Supplier: Rigaku Corporation
Description: The TTRAX III is the world’s most powerful diffractometer. Utilizing an 18 kW rotating anode X-ray source in a ?/? geometry provides the perfect system for demanding applications. Both thin film diffraction and the determination of trace phases in powdered samples benefit
- Detector Type: Other
- Diffraction Method: Powder
- Features: Benchtop, High Resolution / Crystal Quality
- Wave Type: X-Ray
-
-
Supplier: Rigaku Corporation
Description: The Ultima IV represents the state-of-the-art in multipurpose X-ray diffraction (XRD) systems. Incorporating Rigaku's patented cross beam optics (CBO) technology for permanently mounted, permanently aligned and user-selectable parallel and focusing geometries, the Ultima IV X-ray
- Detector Type: Scintillation
- Diffracted Beam Optics: Monochromating Crystal
- Sample/Detector Positioning System: Goniometer
- Wave Type: X-Ray
-
Supplier: Rigaku Corporation
Description: Uses X-rays to non-destructively measures the residual stress accumulated in a material during the manufacturing process. Different frame sizes accommodate small, medium and large samples. The position-sensitive proportional counter (PSPC) permits high-speed measurement. Compared with the
- Detector Type: Other
- Features: Residual Stress Measurement
- Wave Type: X-Ray
-
Supplier: Rigaku Corporation
Description: The SmartLab is the most novel high-resolution diffractometer available today. Perhaps its most novel feature is the SmartLab Guidance software, which provides the user with an intelligent interface that guides you through the intricacies of each experiment. It is like having an expert
- Detector Type: Scintillation
- Diffraction Method: Powder
- Features: Benchtop
- Maximum Specimen Diameter: 200 mm
-
Supplier: Hitachi High-Tech America
Description: Microspot XRF coating thickness and materials analyzers for rapid quality control and validation testing, making it easy to get the right results in seconds. Coating thickness and materials analysis based on X-ray fluorescence (XRF) is a widely accepted and industry-proven analytical
- Applications: Electroplated Films, Semiconductor Wafers
- Maximum Wafer / Part Size: 102 to 305 mm
- Measurement Capability: Composition, Thickness - Film / Layer
- Mounting / Loading: Manual Loading
-
Supplier: Bruker Corporation
Description: Bruker Semiconductor develops, manufactures, markets, and supports metrology solutions for thin films, which are based on novel, rapid, non-contacting and non-destructive X-ray technology. With Bruker™s acquisition of Jordan Valley Semiconductors, a name synonymous with unparalleled
- Applications: Semiconductor Wafers, Other
- Measurement Capability: Defects / ADC, Roughness / Waviness
- Technology: Profilometer / AFM, X-ray Diffractometer
-
Supplier: ASTM International
Description: 1.1 These practices provide for X-ray diffraction analysis of powdered crystalline compounds in water-formed deposits. Two are given as follows: Sections Practice A---Camera 12 to 21 Practice B---Diffractometer 22 to 30
-
Supplier: ASTM International
Description: , vacuum and air-path optical emission spectrometers, plasma emission spectrometers, X-ray emission spectrometers, X-ray diffractometers, and atomic absorption and flame emission spectrophotometers. 1.2 This standard does not purport to address all of the safety concerns, if
-
Supplier: ASTM International
Description: , vacuum and air-path optical emission spectrometers, plasma emission spectrometers, X-ray emission spectrometers, X-ray diffractometers, and atomic absorption and flame emission spectrophotometers. 1.2 This standard does not purport to address all of the safety concerns, if
-
Supplier: ASTM International
Description: 1.1 This test method covers the use of the X-ray diffractometer to prepare quantitative pole figures. 1.2 The test method consists of several experimental procedures. Some of the procedures (1-5) permit preparation of a complete pole figure. Others must be used in combination to
Find Suppliers by Category Top
Conduct Research Top
-
In Search of Consistency
Traditional Bragg-Brentano X-ray diffractometers require precise positioning of source, sample and detector. These limitations, along with large size, make them unsuitable for in-line measurements. Low-density materials and samples with curved surfaces (e.g. pills) or surfaces displaced
More Information Top
Indicates content that may require registration and/or purchase.
-
Dictionary of the geology / Dictionary of Geology
tube-Texturgoniometer n XRD (X-ray diffractometer ) roentgen diffraktometer n, roentgen diffraction apparatus n, XRD n XRF of (X-ray fluorescence spectrometry) roentgen fluorescence spectrometry f, XRF f xylanthrax charcoal f xyloid brown coal xylitische soft brown coal f xyloid lignite vitrinitische …
-
Physics of Semiconductor Devices
The crystal structure was identified with a Theta- Theta X ray diffractometer (XRD) D 5000 with a Goebel mirror in grazing incidence geometry with CuK! radiation.
-
Key Engineering Materials II
The test was performed on X ray diffractometer (X’ Pert Philips) for epoxy/nanoclay samples to study the interlayer separation.
-
The resolution function of a double-crystal X-ray diffractometer
The diffraction reflection curves (DRCs) are con ventionally measured with standard X ray diffracto meters (such as a three crystal X ray spectrometer, precision X ray diffractometers by Bruker, Rigaki, etc.) in the θ–2θ scanning mode (when the studied crystal is turned …
-
Materials Science and Chemical Engineering
The structural properties of the prepared films have been analysed by the XRD studies using PW 1840 X Ray diffractometer with CuKα radiation source.
-
Metrological assurance of measurements of the dimensional parameters of nanoparticles and thin films by small-angle X-ray diffractometry methods
The reli ability of such measurements must be assured by stan dard samples and techniques of calibrating small angle X ray diffractometers .
-
China Functional Materials Technology and Industry Forum
The phases were analyzed by an X ray diffractometer (PANalytical, X'Pert Pro).
-
Advanced Materials and Engineering Materials II
X-ray diffraction(XRD) was carried out for phase identification on this external surface by X ray diffractometer (D8 Discover, Bruker AXS, Germany) using Cu Kα radiation.
-
Environmental and Materials Engineering
Experimental Instruments: Japan D/Max-RB neo-confucianism X ray diffractometer , Japan SSX-550 Island Sea scanning electron microscope, America Nicolet-380 High Force Fourier transform infrared spectrometer, TAS - 990AFG automatic atomic absorption spectrometer, KSW Muffle Furnace, Sartorius PB-10 pH Meter, AB …
-
Advanced Manufacturing Technology, ICMSE 2012
JA1203N electronic balance XRD-7000S X ray diffractometer KYKY-2800B electron microscope .