Semiconductor Metrology Instruments Suppliers in Carlsbad, California

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
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Scientific Computing International
Address: 6355 Corte Del Abeto, Suite C105, Carlsbad, CA 92011 United States
Business Type: Manufacturer
Description: Scientific Computing International (SCI) is a provider of diverse tools for thin-film characterization, metrology, material analysis, spectroscopic ellipsometry and optical thin-film design. Product includes a metrology tool that simultaneously and unambiguously measures thickness, critical... (more)

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