Semiconductor Metrology Instruments Suppliers in Santa Barbara, California

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
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Bruker Nano Surfaces & Metrology
Address: 112 Robin Hill Road, Santa Barbara, CA 93117 United States
Business Type: Manufacturer
Description: Surface Analysis Revealing Surface Interactions, Functionality, and Precise Topography for Research and Industry From leading edge scientific research to high-speed production, Bruker provides the critical surface measurements necessary for success with the world's broadest range of... (more)

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