Semiconductor Metrology Instruments Suppliers in Ramsey, New Jersey

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
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Angstrom Scientific, Inc.
Address: 120 North Central Ave., Unit 3, Ramsey, NJ 07446 United States
Business Type: Distributor

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