Semiconductor Metrology Instruments Suppliers in Cuyahoga Falls, Ohio

Semiconductor metrology instruments are designed for wafer and thin film in-line inspection after semiconductor processing. They include capacitance gages, C-V systems, electron beam probes, ellipsometers, interferometers, I-V system, magnetometers, optical systems, profilometers, reflectometers, resistance probes, RHEED systems, and X-ray diffractometers.   (more)
Nanotronics Imaging
Address: 2101 Front St., Suite 105, Cuyahoga Falls, OH 44221 USA
Business Type: Manufacturer
Description: Fully automated visual inspection solutions have never been this affordable! For nSPEC and nPLACE orders placed by November 15 for delivery in 2011, Nanotronics offers customers a choice of either a) deferral of 80% of the payment until end of January 2012 (only 20% is due... (more)

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