Reducing the Cost of Test with Innovative, High-Efficiency ATE Solutions
Cosmic presents ATE, handler and burn-in solutions for mixed-signal and high-power applications for automotive, industrial, and power semiconductor markets. (read more)

Low-cost, mixed signal, test development ATE system (read more)

Everything you need for fast measurements on SiC, GaN, Si devices and bare die (read more)

The FTI-1000 is designed for high-coverage wafer-level testing of semiconductor devices. (read more)

The Services division provides a full range of test services, from wafer sort and final production testing to characterization, qualification, reliability testing, and advanced failure and technology analysis, as well as ASIC design and design-for-testability (DFT) support to optimize device performance, testability, and time-to-market. (read more)

Cosmic’s Burn-In System is revolutionary
due to its ovenless technology. (read more)

The Burn-In system developed by Cosmic is revolutionary because it is ovenless, introducing disruptive innovation and significant improvements over traditional systems used for microcontrollers. (read more)

With over 25 years of experience in the industry and specialized expertise in ATE design and manufacturing as well as testing services, Cosmic ensures maximum reliability across both semiconductor testing services (WS + FT). (read more)

The HATINA GP is designed for testing complex Smart Power ICs and SoCs. Recommended for high parallelism. (read more)