Surface analysis is an analytical technique to elucidate elemental composition, chemical state, and micro structure from material surface layer (several nm to several µｍ). As phenomena such as corrosion, wear, adhesion, and reactions that impact performance and reliability occur primarily on the surface, surface analysis is vital for material evaluation, quality control, and... (read more)

Our Cross Section Polishers™ (CPs) are widely used broad ion beam milling instruments for preparing specimens for electron microscopy. Eliminating artifacts associated with traditional mechanical preparation methods, the CP produces pristine cross sections of difficult specimens: brittle materials, multilayer coatings with differences in hardness or thermal expansion, fragile porou... (read more)

The JEOL IT810 Ultrahigh Resolution Field Emission SEM is a revolutionary FE-SEM with the most advanced high-resolution analytical technology available today. Versatility and high spatial resolution meet automation and ease of use with the JSM-IT810 series FE SEM. The JEOL IT810 series offers the next level of analytical intelligence for high spatial resolution imaging and analysi... (read more)

EOL is a world leader in the development and manufacture of leading edge, high performance, high stability Transmission Electron Microscopes (TEM). JEOL introduced its first TEM over 70 years ago and has been developing and producing TEMs designed for life sciences and material sciences ever since. Many of the world’s laboratories utilize JEOL TEM/STEMs to further their research ef... (read more)

The JIB-PS500i provides three solutions to assist TEM specimen preparation. High throughput workflow is assured from specimen prepartion to TEM observation. (read more)

By adopting the newly-designed user interface that allows for operation in Japanese environment, ”Easy, Immediate operation just for Anyone” has been realized. In addition, equipping a Kaufman-type etching ion source and a twin anode as standard, the JPS-9030 has a wide range of expandability such as a high temperature heating system and a gas cluster ion source. (read more)

Vacuum Evaporator

The IB-29510VET Vacuum Evaporator facilitates specimen preparation for electron microscopes. Evaporation of carbon thin films suitable for high-resolution observation, evaporation of various metal thin films, shadowing evaporation, or conductive coating for non-conductive materials. It can be also used for thermal processing requiring high vacuum, such as apertur... (read more)

JES-X3 Series
ESR

Recently, it has been widely accepted that even relatively few unpaired electrons in a sample can affect the function of the material, so lower detection limits (higher sensitivity) is required of ESR measurements.
The ESR spectrometer JES-X3 series has an improved a low-noise Gunn oscillator providing a 30% improvement in sensitivity compared to previo... (read more)

SightSKY™ Series High-Sensitivity, Low-Noise, Fiber-Coupling CMOS Camera

High-resolution TEM image and electron diffraction pattern of Al₇₂Fe₂₄Ni₄ decagonal quasi-crystal

Digital Zoom enables observation of atomic structure showing quasi-periodicity, such as shown when imaging quasi-crystals.

Moreover, the high dynamic range off... (read more)

・High-sensitivity, low-noise 19 M pixel CMOS sensor enables imaging of fine specimen detail and obtains high signal to noise images even at low electron doses.
・A Global shutter and high frame rate (58 fps/full pixel mode) enable image series acquisitions with less artifacts during in-situ dynamic observation studies.
・The SightSKY™ camera system offe... (read more)

A new publication in Ultramicroscopy details a breakthrough in magnetic field-free TEM/STEM imaging—featuring the first wide-gap pole piece developed for the JEOL MARS.
Authored by Tatsuhiro Maekawa of JEOL Ltd. and Prof. Arakawa of Shimane University, this study introduces an innovative image-forming system that enables conventional TEM imaging (bright/dark field) without mag... (read more)

The CRYO-FIB-SEM system incorporates a liquid nitrogen cooling stage and a cryocooled specimen transfer mechanism. (read more)

Transmission Electron Microscopes (TEM) of 120kV accelerating voltage are widely used in soft material fields such as biology and polymer. (read more)