Fully automated visual inspection solutions have never been this affordable!

For nSPEC and nPLACE orders placed by November 15 for delivery in 2011, Nanotronics offers customers a choice of either
a) deferral of 80% of the payment until end of January 2012 (only 20% is due upon order's placement), or
b) extension of free warranty and upgrades for additional 12 months, to the total of 2 years (up to $25,000 value).

Please contact Ivan Eliashevich at ieliashevich@nanotronicsimaging.com for details.

With a history in material science and laboratory instrumentation, Nanotronics Imaging is the latest venture in the founders' pursuit of technology and customer focused design and implementation. Nanotronics imaging was founded in 2008 by Matthew Putman and John Putman after the sale of their 25 year old instrument business Tech Pro, Inc. to Roper Industries.

In 2001, Tech Pro entered the field of rapid industrial microscopy with the purchase of the rights to a Swedish automated reflected-light microscope called the DisperGRADER. Over the next several years Tech Pro greatly increased the range of the DisperGRADER by including quantitative data analysis, a sample preparation system, and a new design which removed embedded systems in favor of control from the PC. Tech Pro increased the speed and the potential for the product to be used in other applications than tire control.

The DisperGRADER remains the world leader in this type of measurement, and is used my companies such as Michelin, Goodyear, Rhodia, Continental, DuPont and hundreds of others. Tech Pro had 2 patents for the DisperGRADER and wrote, published and presented papers worldwide on both the microscope and the applications for its use.

The lessons learned from years dealing with clients, and especially the integration of the DisperGRADER inspired the choice of John Putman and Matthew Putman to start the venture Nanotronics Imaging. In 2004, Matthew began a Ph.D dissertation on a next generation of high resolution optical microscope that would have the ease of use of the DisperGRADER, but the power of a confocal microscope. The early prototypes were made by the Putmans and two engineers during the completion of the dissertation, and Matthew was convinced that while sensor design had not yet caught up with the vision, the concept was appropriate for the dissertation, and eventually a product. After the sale of Tech Pro, John, Matthew and a combination of three former Tech Pro engineers started Nanotronics Imaging.

nSPEC™ is a fully automatic optical inspection system for analyzing transparent and semi-transparent wafers for defects. The reports of defect classification and mapping may be custom configured or selected from the provided report templates and library of standard defects.

Reports may include density maps, histograms, defect count and applicable statistics, all of which can be configured for the user’s special requirements.

The inspection system design allows easy set up for repeated quality control testing, but can be set for single image capture or scans. Configuration options include wafer size, types of defects to be identified and resolution of scan. Various sample chucks are available to meet specific needs.

The system is delivered fully functional and includes installation and training. The nSPEC™ has a two year warranty which includes software maintenance and updates.