About
Scientific Computing International (SCI) is a provider of diverse tools for thin-film characterization, metrology, material analysis, spectroscopic ellipsometry and optical thin-film design. Product includes a metrology tool that simultaneously and unambiguously measures thickness, critical dimensions, surface roughness, composition, crystallinity and optical constants of multilayer structures.
Provider of diverse tools for thin-film characterization, metrology, material analysis, spectroscopic ellipsometry and optical thin-film design. Product includes a metrology tool that simultaneously and unambiguously measures thickness, critical dimensions, surface roughness, composition, crystallinity and optical constants of multilayer structures. - See more at: http://photonics.com/Company.aspx?CompanyID=13246#sthash.UusdzTtK.dpuf
Provider of diverse tools for thin-film characterization, metrology, material analysis, spectroscopic ellipsometry and optical thin-film design. Product includes a metrology tool that simultaneously and unambiguously measures thickness, critical dimensions, surface roughness, composition, crystallinity and optical constants of multilayer structures. - See more at: http://photonics.com/Company.aspx?CompanyID=13246#sthash.UusdzTtK.dpuf
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