Nanometer Measurement
The Nano-Gauge™ is an ultra high precision, single axis, displacement measuring instrument capable of resolving dimensions down to 1.5 nanometers (0.06 microinches) over a full scale range of 25mm (1 inch). Combining ease-of-use and small physical size, the Nano-Gauge™ can be quickly adapted to a wide variety of precision measurement situations without lengthy or complex setup procedures.

Applications

• Nanopositioner calibration
• Transducer calibration
• Alignment
• Position creep measurements

Features

• 1.5nm or 5nm linear displacement measurement
• 25mm total range of measurement
• USB output to PC
• Optional probe types
• Compact sensor head
• Easy to use

Mad City Labs, Inc
Mad City Labs, Inc has been a leading manufacturer of flexure based piezo nanopositioning systems capable of sub-nanometer positioning resolution since 1998. Our piezo nanopositioning product line covers the entire spectrum of piezo nanopositioning capabilities while maintaining a leadership role in multi-axis stages for high speed optical microscopy imaging. Mad City Labs engineers use 3D CAD and finite element analysis to produce piezo nanopositioners which combine long ranges of motion with exceptional linearity, orthogonality, and stability. Our in-house CNC machining centers and wire EDMs provide complete control of mechanical assembly production and allow Mad City Labs to design and fabricate custom systems with minimal engineering costs and short lead times. We deliver the tools for nanotechnology in 30 to 45 days and provide the highest level of customer service and satisfaction in the industry. We provide innovative and practical solutions for today’s demanding biotechnology and nanotechnology applications. Most Mad City Labs piezo nanopositioners can be controlled by our high speed USB 2.0 interface. Applications for nanopositioners include super resolution microscopy, high speed confocal imaging, AFM, NSOM, scanning probe microscopy, fiber positioning, single molecule spectroscopy, single molecule/particle tracking, high resolution optical alignment, SR optical microscopy, sub-diffraction limit microscopy, nanoscopy and lithography.