Product Announcements:
Vector Network Analyzers

The VectorStar ME7848A opto-electronic network analyzer (ONA) provides a modular approach to optical measurements of O/E, E/O, and O/O devices operating at 850, 1310, and 1550 nm wavelengths. There are two configurations available: the VectorStar ME7848A-100 series includes the MN4765B O/E calibration module and the VectorStar ME7848A-200 series adds the MN4775A E/O converter. Read more...

Anritsu's ME7838 VNA series offers exceptional performance up to 220 GHz with stability for on-wafer mmWave measurements. It boasts the world's first single-sweep spectrum analyzer option up to 220 GHz. Read more...

Anritsu's VectorStar MS4640B VNA offers top performance from 70 kHz to 70 GHz. It features real-time displays for IMD, pulse, and differential measurements with innovative options like PulseView™ and DifferentialView™. Read more...

The ShockLine MS46524B is a 4-port VNA for efficient testing of multiport devices up to 43.5 GHz. Ideal for 5G development, it offers cost-effective testing of differential cables, high-speed interconnects, and more. Read more...

The ShockLine MS46522B is a high-performance VNA for testing devices up to 92 GHz. It offers exceptional value for cost-effective testing of 5G mmWave devices, cables, and more. Optional E-band extensions provide new levels of performance for millimeter-wave measurements Read more...

The ShockLine MS46322B is an affordable vector network analyzer (VNA) for testing devices up to 43.5 GHz. It offers good performance in a compact & rugged design with remote control for integration into test systems. Read more...

The ShockLine MS46122B is a compact & affordable vector network analyzer (VNA) for testing passive devices up to 43.5 GHz. Controlled by PC via USB, it offers high performance in a small size, ideal for shared use or limited bench space. Read more...

The Siglent SNA5000A series of Vector Network Analyzers has a low noise floor and wide dynamic range for accurate measurements in many unique RF applications, including bandwidth, limit testing, scattering, differential and time-domain measurements, Q-factor, insertion loss, ripple test, and fixture simulation. Read more...