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About

Copper Mountain Technologies develops innovative and robust RF test and measurement solutions for engineers all over the world. The company was created in 2011 and is based in Indianapolis, IN with a sales office in Singapore. Our innovative products and partnership approach enable RF and Microwave engineers to realize their potential through access to lab-grade instrumentation at affordable prices. Our world-class metrology and engineering resources work as an extension of your team.

Copper Mountain Technologies’ VNAs include an RF measurement module and a software application which runs on a Windows PC, laptop, or tablet, connecting to the measurement hardware via USB interface. The user can take advantage of the latest OS, processing power, larger display, and reliable performance of an external PC, as well as lower total cost of ownership and simplified maintenance of the analyzer. The result is a faster, more effective test process that fits into the modern workspace in lab, production, field, and secure testing environments. This creative approach made Copper Mountain Technologies a leader in the industry and earned us the 2015 Frost & Sullivan Global Leadership in Innovation Award and 2017 Frost & Sullivan Global USB VNA Product Leadership Award.

Our engineers like to step outside the boundaries of convention when they develop VNAs. They use the latest available technologies and components, and continuously improve product selection and service. As an RF test and measurement leader, we contribute our technical and metrology expertise to solving your challenging problems. The goal is to help engineers and developers extend their reach by equipping them with cutting-edge test instruments that are accurate, small, lightweight, and affordable.

 

 

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Technical Articles

Why USB VNAs? (Electrical and Electronic Test Equipment) USB VNAs increase productivity and lower costs for test, quality control, and design applications, capitalizing on the ever-increasing performance of personal computers. Engineers using this format... (View Full Article)
A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz (Electrical and Electronic Test Equipment) This paper from Compass Technology Group presents a new measurement method based on the parallel plate capacitor concept, which determines complex permittivity of dielectric sheets and films with... (View Full Article)